High-frequency sub-wavelength IR thermal source
2014 (English)In: Proceedings of SPIE, the International Society for Optical Engineering, ISSN 0277-786X, Vol. 9133, 91331D-1-91331D-6 p.Article in journal (Refereed) Published
We present a method to characterize the temperature dynamics of miniaturized thermal IR sources. The method circumvents the limitations of current IR photodetectors, by relying only on an electrical measurement rather than on optical detection. Thus, it enables the characterization of the light emission of IR sources over their full operation frequency range. Moreover, we develop a model of thermal IR sources allowing simulations of their thermal and electrical behavior. By combining measurements and modeling, we achieve a comprehensive characterization of a Pt nanowire IR source: the reference resistance R-0 = 17.7 Omega, the TCR alpha = 2.0 x 10(-3) K-1, the thermal mass C = 2.7 x 10(-14) J/K, and the thermal conductance G = 1.3 x 10(-6) W/K. The thermal time constant could not be measured, because of the frequency limitation of our setup. However, the operation of the source has been tested and proved to function up to 1 MHz, indicating that the thermal time constant of the source is smaller than 1 mu s.
Place, publisher, year, edition, pages
2014. Vol. 9133, 91331D-1-91331D-6 p.
IR source, platinum nanowire, frequency response
IdentifiersURN: urn:nbn:se:kth:diva-144851DOI: 10.1117/12.2052457ISI: 000338590400031ScopusID: 2-s2.0-84903166156OAI: oai:DiVA.org:kth-144851DiVA: diva2:719696
Silicon Photonics and Photonic Integrated Circuits IV; Brussels; Belgium; 14 April 2014 through 17 April 2014
QC 201408132014-05-262014-04-292014-08-13Bibliographically approved