Speckle-Based X-Ray Phase-Contrast and Dark-Field Imaging with a Laboratory Source
2014 (English)In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 112, no 25, 253903- p.Article in journal (Refereed) Published
We report on the observation and application of near-field speckles with a laboratory x-ray source. The detection of speckles is possible thanks to the enhanced brilliance properties of the used liquid-metal-jet source, and opens the way to a range of new applications in laboratory-based coherent x-ray imaging. Here, we use the speckle pattern for multimodal imaging of demonstrator objects. Moreover, we introduce algorithms for phase and dark-field imaging using speckle tracking, and we show that they yield superior results with respect to existing methods.
Place, publisher, year, edition, pages
American Physical Society , 2014. Vol. 112, no 25, 253903- p.
Scattering, Information, Tomography, Retrieval
Other Physics Topics
IdentifiersURN: urn:nbn:se:kth:diva-148281DOI: 10.1103/PhysRevLett.112.253903ISI: 000338284900009ScopusID: 2-s2.0-84903522889OAI: oai:DiVA.org:kth-148281DiVA: diva2:736628
FunderEU, FP7, Seventh Framework Programme, StG 240142 279753
QC 201408072014-08-072014-08-052016-09-21Bibliographically approved