Impact of dielectric permittivity of a substrate on the THz scattering enhanced due to near-field effect
2010 (English)In: 2010 Asia Communications and Photonics Conference and Exhibition, ACP 2010, IEEE , 2010, 330-331 p.Conference paper (Refereed)
Enhanced scattering of the THz radiation caused by the interaction of near field component with plasmons in a substrate material results in sub-wavelength resolution within THz range. Variation of dielectric permittivity of organic materials placed on a metal substrate can improve contrast of the image obtained with such a technique.
Place, publisher, year, edition, pages
IEEE , 2010. 330-331 p.
Dielectric permittivities, Enhanced scattering, Metal substrate, Near field effect, Near fields, Organic materials, Substrate material, Subwavelength resolution, THz radiation, Dielectric materials, Permittivity, Terahertz waves, Photonics
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-150096DOI: 10.1109/ACP.2010.5682535ScopusID: 2-s2.0-79851494038ISBN: 978-142447111-9OAI: oai:DiVA.org:kth-150096DiVA: diva2:741833
Asia Communications and Photonics Conference and Exhibition, ACP 2010, 8 December 2010 through 12 December 2010, Shanghai, China
QC 201408292014-08-292014-08-292014-08-29Bibliographically approved