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Refractive index sensor performance based on enhanced transmission of light through perforated metallic films
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP. Aalto University, Finland .
2010 (English)In: 2010 Asia Communications and Photonics Conference and Exhibition, ACP 2010, 2010, 328-329 p.Conference paper, Published paper (Refereed)
Abstract [en]

The transmission of light through a thin Au film with periodic subwavelength double nanoholes at normal incidence is analyzed numerically and compared to other conventional hole shapes. The performance of such perforated metallic films as a potential refractive index sensor is discussed.

Place, publisher, year, edition, pages
2010. 328-329 p.
Keyword [en]
Au film, Enhanced transmission, Nanoholes, Normal incidence, Refractive index sensor, Sub-wavelength, Gold, Light refraction, Metallic films, Photonics, Refractive index, Refractometers, Sensors, Light transmission
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Other Physics Topics
Identifiers
URN: urn:nbn:se:kth:diva-150019DOI: 10.1109/ACP.2010.5682534Scopus ID: 2-s2.0-79851486826ISBN: 978-142447111-9 (print)OAI: oai:DiVA.org:kth-150019DiVA: diva2:742317
Conference
Asia Communications and Photonics Conference and Exhibition, ACP 2010, 8 December 2010 through 12 December 2010, Shanghai, China
Note

QC 20140901

Available from: 2014-09-01 Created: 2014-08-29 Last updated: 2014-09-01Bibliographically approved

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