In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy
2014 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 116, no 3, 034902- p.Article in journal (Refereed) Published
We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy.
Place, publisher, year, edition, pages
2014. Vol. 116, no 3, 034902- p.
Other Chemical Engineering
IdentifiersURN: urn:nbn:se:kth:diva-150937DOI: 10.1063/1.4890318ISI: 000340710500089ScopusID: 2-s2.0-84904646508OAI: oai:DiVA.org:kth-150937DiVA: diva2:746183
QC 201409122014-09-122014-09-112014-09-12Bibliographically approved