Nanoscale characterization of beta-phase HxLi1-xNbO3 layers by piezoresponse force microscopy
2014 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 116, no 6, 066815- p.Article in journal (Refereed) Published
We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d(33) coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 +/- 2% and 68 +/- 3% of the LiNbO3 value, for undoped and 5mol. % MgO-doped substrates, respectively.
Place, publisher, year, edition, pages
2014. Vol. 116, no 6, 066815- p.
Niobium oxide, Optical data processing, Refractive index, Nanoscale characterization, Non destructive, Optical measurement, Piezoresponse force microscopy, Proton exchange, Proton exchanged, Systematic analysis
Other Physics Topics
IdentifiersURN: urn:nbn:se:kth:diva-152585DOI: 10.1063/1.4891352ISI: 000341179400093ScopusID: 2-s2.0-84906303081OAI: oai:DiVA.org:kth-152585DiVA: diva2:750525
FunderSwedish Research Council, VR 622-2010-526 621-2011-4040
QC 201409292014-09-292014-09-292015-03-25Bibliographically approved