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Intrinsic reliability of AlOx-based magnetic tunnel junctions
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
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2006 (English)Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2006.
Series
INTERMAG 2006 - IEEE International Magnetics Conference
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-155430DOI: 10.1109/INTMAG.2006.376453Scopus ID: 2-s2.0-50249104696ISBN: 1424414792 (print)ISBN: 9781424414796 (print)OAI: oai:DiVA.org:kth-155430DiVA: diva2:762283
Conference
INTERMAG 2006 - IEEE International Magnetics Conference; San Diego, CA; United States; 8 May 2006 through 12 May 2006
Note

QC 20141111

Available from: 2014-11-11 Created: 2014-11-05 Last updated: 2014-11-11Bibliographically approved

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Åkerman, Johan
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CiteExportLink to record
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