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Non-proportionality and Energy Resolution of CsI(Tl)
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2007 (English)In: 2006 IEEE Nuclear Science Symposium Conference Record, IEEE , 2007, 1144-1149 p.Conference paper, Published paper (Refereed)
Abstract [en]

Experimental studies of CsI(Tl) crystals with different amount of Tl activator are presented. Such properties like non-proportionality, energy resolution and number of photoelectrons per 1 MeV-γ were inspected at two different shaping time constants, i.e. 3 and 12 μs. A CsT(Tl) crystal was coupled to the XP5212 PMT with a photocathode blue sensitivity of 12.2μA/lmF. Six GsI(Tl) crystals of different size were tested. Among them three samples were of known Tl concentration which amounted roughly 0.05, 0.1 and 0.25 mol%. The data analysis showed much more proportional character of the crystal response, higher number of photoelectrons/MeV-γ, and what follows better overall energy resolution obtained for 12 μs time constant for all tested samples. Calculated intrinsic resolution improved at longer shaping time constant as well, indicating that for CsI(Tl) crystals more proportional response implies better intrinsic energy resolution of the host crystal. In contrast, intrinsic resolution at low energy region (below about 30 keV) deteriorated for the longer shaping time constant. An α/γ ratio was also measured for each tested CsI(Tl) crystal in order to find any indication to an explanation of the intrinsic resolution deterioration for low energy photons at the 12 μs integration time.

Place, publisher, year, edition, pages
IEEE , 2007. 1144-1149 p.
Series
IEEE Nuclear Science Symposium Conference Record, ISSN 1095-7863 ; 2
Keyword [en]
CsI(Tl), Energy resolution, Non-proportionality
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-155275DOI: 10.1109/NSSMIC.2006.356047ISI: 000288875601042Scopus ID: 2-s2.0-38649136970ISBN: 1424405610 (print)ISBN: 978-142440561-9 OAI: oai:DiVA.org:kth-155275DiVA: diva2:762498
Conference
2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD, 29 October 2006 through 4 November 2006, San Diego, CA, United States
Note

QC 20141112

Available from: 2014-11-12 Created: 2014-11-04 Last updated: 2014-11-12Bibliographically approved

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