Conference reports: DATE 07 workshop on diagnostic services in NoCs
2007 (English)In: IEEE Design & Test of Computers, ISSN 0740-7475, E-ISSN 1558-1918, Vol. 24, no 5, 510- p.Article in journal (Refereed) Published
1. TTTC Forum honors Melvin Breuer - at the 2006 International Test Conference, a half-day technical forum was held to honor Melvin Breuer, a pioneer in the areas of VLSI design automation and test; 2. Design flow and methodology addressed at SOC 2006 - The International Symposium on System-on-Chip took place on 13-16 November 2006 in Tampere, Finland. The theme was "SoC Design Flow and Methodology." There were nine high-caliber, 45-minute invited talks, covering different approaches and application areas in SoC design.
Place, publisher, year, edition, pages
2007. Vol. 24, no 5, 510- p.
ITC, Melvin Breuer, SOC 2006, SoC design
Other Computer and Information Science
IdentifiersURN: urn:nbn:se:kth:diva-155589DOI: 10.1109/MDT.2007.162ScopusID: 2-s2.0-35348821262OAI: oai:DiVA.org:kth-155589DiVA: diva2:765126
QC 201411212014-11-212014-11-072014-11-21Bibliographically approved