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Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip-surface interactions
KTH, Centres, Nordic Institute for Theoretical Physics NORDITA.ORCID iD: 0000-0003-2810-9203
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0003-0675-974X
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8534-6577
2014 (English)In: Beilstein Journal of Nanotechnology, ISSN 2190-4286, Vol. 5, p. 1899-1904Article in journal (Refereed) Published
Abstract [en]

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip-surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

Place, publisher, year, edition, pages
2014. Vol. 5, p. 1899-1904
Keywords [en]
atomic force microscopy, calibration, multimodal AFM, multifrequency AFM
National Category
Nano Technology
Identifiers
URN: urn:nbn:se:kth:diva-157006DOI: 10.3762/bjnano.5.200ISI: 000344193400001PubMedID: 25383301Scopus ID: 2-s2.0-84987648025OAI: oai:DiVA.org:kth-157006DiVA, id: diva2:768990
Funder
Swedish Research Council, 621-2012- 2983Knut and Alice Wallenberg Foundation
Note

QC 20141205

Available from: 2014-12-05 Created: 2014-12-04 Last updated: 2017-12-05Bibliographically approved

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Forchheimer, DanielHaviland, David B.

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