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Detecting bilateral symmetry in perspective
KTH, School of Computer Science and Communication (CSC), Computer Vision and Active Perception, CVAP.
KTH, School of Computer Science and Communication (CSC), Computer Vision and Active Perception, CVAP.
2006 (English)In: Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2006Conference paper, Published paper (Refereed)
Abstract [en]

A method is presented for efficiently detecting bilateral symmetry on planar surfaces under perspective projection. The method is able to detect local or global symmetries, locate symmetric surfaces in complex backgrounds, and detect multiple incidences of symmetry. Symmetry is simultaneously evaluated across all locations, scales, orientations and under perspective skew. Feature descriptors robust to local affine distortion are used to match pairs of symmetric features. Feature quadruplets are then formed from these symmetric feature pairs. Each quadruplet hypothesises a locally planar 3D symmetry that can be extracted under perspective distortion. The method is posed independently of a specific feature detector or descriptor. Results are presented demonstrating the efficacy of the method for detecting bilateral symmetry under perspective distortion. Our unoptimised Matlab implementation, running on a standard PC, requires of the order of 20 seconds to process images with 1,000 feature points.

Place, publisher, year, edition, pages
2006.
Series
Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, ISSN 1063-6919 ; 2006
Keyword [en]
3D symmetry, Bilateral symmetry, Feature descriptors, Feature extraction, Image processing, Robustness (control systems), Computational geometry
National Category
Computer Science
Identifiers
URN: urn:nbn:se:kth:diva-155828DOI: 10.1109/CVPRW.2006.63Scopus ID: 2-s2.0-33845537226ISBN: 0769526462 (print)ISBN: 9780769526461 (print)OAI: oai:DiVA.org:kth-155828DiVA: diva2:769517
Conference
2006 Conference on Computer Vision and Pattern Recognition Workshops, 17 June 2006 through 22 June 2006, New York, NY
Note

QC 20141208

Available from: 2014-12-08 Created: 2014-11-13 Last updated: 2014-12-08Bibliographically approved

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CiteExportLink to record
Permanent link

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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf