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Automatic generation of breakpoint hardware for silicon debug
KTH.
2004 (English)In: Proceedings of the 41st Design Automation Conference, IEEE Computer Society, 2004, 514-517 p.Conference paper, Published paper (Refereed)
Abstract [en]

Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of break-point modules during the design stage of the chip. This paper focuses on an innovative approach to automatically generate breakpoint modules by means of a breakpoint description language. This language is illustrated using an example, and experimental results are presented that show the efficiency and effectiveness of this new method for generating breakpoint hardware.

Place, publisher, year, edition, pages
IEEE Computer Society, 2004. 514-517 p.
Series
Proceedings - Design Automation Conference, ISSN 0738-100X
Keyword [en]
Design, Break-point description language (BDL), Performance analysis, Scan-based silicon debug, Computer aided design, Computer aided software engineering, Computer hardware, Computer programming languages, Computer simulation, Program debugging, Silicon, Microprocessor chips
National Category
Other Computer and Information Science Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-157186ISI: 000223078800110Scopus ID: 2-s2.0-4444239919ISBN: 1-58113-828-8 (print)OAI: oai:DiVA.org:kth-157186DiVA: diva2:770039
Conference
Proceedings of the 41st Design Automation Conference, 7 June 2004 through 11 June 2004, San Diego, CA, United States
Note

QC 20141209

Available from: 2014-12-09 Created: 2014-12-08 Last updated: 2014-12-09Bibliographically approved

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CiteExportLink to record
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Citation style
  • apa
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More styles
Language
  • de-DE
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  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
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  • Other locale
More languages
Output format
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  • asciidoc
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