Determining surface properties with bimodal and multimodal AFM
2014 (English)In: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 25, no 48, 485708- p.Article in journal (Refereed) Published
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two or more resonance frequencies. Such excitation schemes result in one additional amplitude and phase images for each driven resonance, and potentially convey more information about the surface under investigation. Here we present a theoretical basis for using this information to approximate the parameters of a tip-surface interaction model. The theory is verified by simulations with added noise corresponding to room-temperature measurements.
Place, publisher, year, edition, pages
2014. Vol. 25, no 48, 485708- p.
atomic force microscopy, multifrequency AFM, surface properties
IdentifiersURN: urn:nbn:se:kth:diva-158801DOI: 10.1088/0957-4484/25/48/485708ISI: 000345286400024ScopusID: 2-s2.0-84911091674OAI: oai:DiVA.org:kth-158801DiVA: diva2:785972
FunderKnut and Alice Wallenberg FoundationSwedish Research Council
QC 201502042015-02-042015-01-122015-02-09Bibliographically approved