Following the Island Growth in Real Time: Ag Nanocluster Layer on A1q3 Thin Film
2015 (English)In: The Journal of Physical Chemistry C, ISSN 1932-7447, E-ISSN 1932-7455, Vol. 119, no 8, 4406-4413 p.Article in journal (Refereed) Published
The progress of organic electronics demands an increased participation of nanotechnology, and it has already been shown that the presence of metallic nanoparticles and/or nanostructured thin films can enhance the device performance. Nevertheless, to gain control over the device final performance, it is crucial to achieve a profound understanding of the nanostructure development and assembly. We investigate the growth kinetics of silver (Ag) on a tris(8-hydroxyquinolinato)aluminum (Alq3) thin film via sputter deposition. The increase of the average electron density of the Ag nanostructured film is observed to follow a sigmoidal shape development as a function of the deposited Ag thickness, as a consequence of dominant island-mediated growth. The nanoclustered film is percolated at around a thickness of 5.0 +/- 0.1 nm. At this film thickness the effective film density is about 50%. Moreover, our simulation results indicate that the shape of the nanoclusters changes from truncated spheres to cylinders upon surpassing the percolation threshold.
Place, publisher, year, edition, pages
2015. Vol. 119, no 8, 4406-4413 p.
IdentifiersURN: urn:nbn:se:kth:diva-164000DOI: 10.1021/jp512675wISI: 000350329300057ScopusID: 2-s2.0-84924007083OAI: oai:DiVA.org:kth-164000DiVA: diva2:808002
FunderKnut and Alice Wallenberg Foundation
QC 201504272015-04-272015-04-132015-04-27Bibliographically approved