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Evaluation of Alternative LBIST Flows: A Case Study
KTH, School of Information and Communication Technology (ICT), Electronic Systems.
KTH, School of Information and Communication Technology (ICT), Electronic Systems.ORCID iD: 0000-0001-7382-9408
Development Unit Radio, Ericsson AB, Sweden.
2014 (English)In: Proceedings of 32nd Nordic Microelectronics Conference (NORCHIP'2014), 2014Conference paper, Published paper (Refereed)
Abstract [en]

The cost of manufacturing test has been growing dramatically over the years. The traditional pseudo-random pattern based Logic Built-in Self Test (LBIST) can potentially reduce the test cost by minimizing the need for the automatic test equipment. However, LBIST test coverage can be unaccept-ably low for some designs. Various methods for complementing pseudo-random patterns to increase test coverage exist, but the combined effect of these methods has not been studied. In this paper, we evaluate the effectiveness of alternative LBIST flows by a case study on a real industrial design. Our results can guide the selection of the best LBIST flow for a given set of design constraints such as test coverage, area overhead, and test time.

Place, publisher, year, edition, pages
2014.
Keyword [en]
LBIST, LFSR, manufacturing test, top-off patterns
National Category
Computer Sciences
Research subject
Computer Science
Identifiers
URN: urn:nbn:se:kth:diva-165461DOI: 10.1109/NORCHIP.2014.7004708Scopus ID: 2-s2.0-84921483971ISBN: 9781479954421 (print)OAI: oai:DiVA.org:kth-165461DiVA: diva2:808486
Conference
32nd Nordic Microelectronics Conference (NORCHIP'2014)
Funder
Swedish Foundation for Strategic Research
Note

QC 20150508

Available from: 2015-04-28 Created: 2015-04-28 Last updated: 2018-01-11Bibliographically approved
In thesis
1. Improvements in High-Coverage and Low-Power LBIST
Open this publication in new window or tab >>Improvements in High-Coverage and Low-Power LBIST
2015 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

Testing cost is one of the major contributors to the manufacturing cost of integrated circuits. Logic Built-In Self Test (LBIST) offers test cost reduction in terms of using smaller and cheaper ATE, test data volume reduction due to on-chip test pattern generation, test time reduction due to at-speed test pattern application. However, it is difficult to reach a sufficient test coverage with affordable area overhead using LBIST. Also, excessive power dissipation during test due to the random nature of LBIST patterns causes yield-decreasing problems such as IR-drop and overheating.

In this dissertation, we present techniques and algorithms addressing these problems.

In order to increase test coverage of LBIST, we propose to use on-chip circuitry to store and generate the "top-off" deterministic test patterns. First, we study the synthesis of Registers with Non-Linear Update (RNLUs) as on-chip sequence generators. We present algorithms constructing RNLUs which generate completely and incompletely specified sequences. Then, we evaluate the effectiveness of RNLUs generating deterministic test patterns on-chip. Our experimental results show that we are able to achieve higher test coverage with less area overhead compared to test point insertion. Finally, we investigate the possibilities of integrating the presented on-chip deterministic test pattern generator with existing Design-For-Testability (DFT) techniques with a case study.

The problem of excessive test power dissipation is addressed with a scan partitioning algorithm which reduces capture power for delay-fault LBIST. The traditional S-graph model for scan partitioning does not quantify the dependency between scan cells. We present an algorithm using a novel weighted S-graph model in which the weights are scan cell dependencies determined by signal probability analysis. Our experimental results show that, on average, the presented method reduces average capture power by 50% and peak capture power by 39% with less than 2% drop in the transition fault coverage. By comparing the proposed algorithm to the original scan partitioning, we show that the proposed method is able to achieve higher capture power reduction with less fault coverage drop.

Place, publisher, year, edition, pages
Stockholm: KTH Royal Institute of Technology, 2015. xi, 84 p.
Series
TRITA-ICT-ECS AVH, ISSN 1653-6363 ; 15:05
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-165463 (URN)978-91-7595-538-4 (ISBN)
Public defence
2015-06-01, Sal A, Isafjordsgatan 26, Kista, 13:00 (English)
Opponent
Supervisors
Note

QC 20150508

Available from: 2015-05-08 Created: 2015-04-28 Last updated: 2018-01-11Bibliographically approved

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Dubrova, Elena

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