Change search
ReferencesLink to record
Permanent link

Direct link
Secure and Efficient LBIST for Feedback Shift Register-Based Cryptographic Systems
KTH, School of Information and Communication Technology (ICT), Electronics and Embedded Systems.ORCID iD: 0000-0001-7382-9408
Ericsson Research, Sweden .
Ericsson Research, Sweden .
2014 (English)In: Proceedings of 19th IEEE European Test Symposium (ETS'2014), IEEE conference proceedings, 2014Conference paper (Refereed)
Abstract [en]

Cryptographic methods are used to protect confidential information against unauthorised modification or disclo-sure. Cryptographic algorithms providing high assurance exist, e.g. AES. However, many open problems related to assuring security of a hardware implementation of a cryptographic algorithm remain. Security of a hardware implementation can be compromised by a random fault or a deliberate attack. The traditional testing methods are good at detecting random faults, but they do not provide adequate protection against malicious alterations of a circuit known as hardware Trojans. For example, a recent attack on Intel's Ivy Bridge processor demonstrated that the traditional Logic Built-In Self-Test (LBIST) may fail even the simple case of stuck-at fault type of Trojans. In this paper, we present a novel LBIST method for Feedback Shift Register (FSR)-based cryptographic systems which can detect such Trojans. The specific properties of FSR-based cryptographic systems allow us to reach 100% single stuck-at fault coverage with a small set of deterministic tests. The test execution time of the proposed method is at least two orders of magnitude shorter than the one of the pseudo-random pattern-based LBIST. Our results enable an efficient protection of FSR-based cryptographic systems from random and malicious stuck-at faults.

Place, publisher, year, edition, pages
IEEE conference proceedings, 2014.
Keyword [en]
BIST, FSR, secure, stuck-at fault
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
URN: urn:nbn:se:kth:diva-165588DOI: 10.1109/ETS.2014.6847821ISI: 000361019900032ScopusID: 2-s2.0-84904479968OAI: diva2:808618
European Test Symposium (ETS'2014)
Swedish Foundation for Strategic Research , SM12-0005

QC 20150507

Available from: 2015-04-29 Created: 2015-04-29 Last updated: 2015-10-08Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Dubrova, Elena
By organisation
Electronics and Embedded Systems
Electrical Engineering, Electronic Engineering, Information Engineering

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Altmetric score

Total: 27 hits
ReferencesLink to record
Permanent link

Direct link