Secure and Efficient LBIST for Feedback Shift Register-Based Cryptographic Systems
2014 (English)In: Proceedings of 19th IEEE European Test Symposium (ETS'2014), IEEE conference proceedings, 2014Conference paper (Refereed)
Cryptographic methods are used to protect confidential information against unauthorised modification or disclo-sure. Cryptographic algorithms providing high assurance exist, e.g. AES. However, many open problems related to assuring security of a hardware implementation of a cryptographic algorithm remain. Security of a hardware implementation can be compromised by a random fault or a deliberate attack. The traditional testing methods are good at detecting random faults, but they do not provide adequate protection against malicious alterations of a circuit known as hardware Trojans. For example, a recent attack on Intel's Ivy Bridge processor demonstrated that the traditional Logic Built-In Self-Test (LBIST) may fail even the simple case of stuck-at fault type of Trojans. In this paper, we present a novel LBIST method for Feedback Shift Register (FSR)-based cryptographic systems which can detect such Trojans. The specific properties of FSR-based cryptographic systems allow us to reach 100% single stuck-at fault coverage with a small set of deterministic tests. The test execution time of the proposed method is at least two orders of magnitude shorter than the one of the pseudo-random pattern-based LBIST. Our results enable an efficient protection of FSR-based cryptographic systems from random and malicious stuck-at faults.
Place, publisher, year, edition, pages
IEEE conference proceedings, 2014.
BIST, FSR, secure, stuck-at fault
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-165588DOI: 10.1109/ETS.2014.6847821ISI: 000361019900032ScopusID: 2-s2.0-84904479968OAI: oai:DiVA.org:kth-165588DiVA: diva2:808618
European Test Symposium (ETS'2014)
FunderSwedish Foundation for Strategic Research , SM12-0005
QC 201505072015-04-292015-04-292015-10-08Bibliographically approved