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Matched Backprojection Operator for Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrücken, Germany.
KTH, School of Engineering Sciences (SCI), Mathematics (Dept.).ORCID iD: 0000-0003-0727-9561
NM Leibniz Institute for New Materials, 66123 Saarbrücken, Germany.
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrücken, Germany.
2015 (English)In: Microscopy and Microanalysis, ISSN 1431-9276, E-ISSN 1435-8115, Vol. 21, no 3, 725-738 p.Article in journal (Refereed) Published
Abstract [en]

Combined tilt- and focal series scanning transmission electron microscopy is a recently developed method to obtain nanoscale three-dimensional (3D) information of thin specimens. In this study, we formulate the forward projection in this acquisition scheme as a linear operator and prove that it is a generalization of the Ray transform for parallel illumination. We analytically derive the corresponding backprojection operator as the adjoint of the forward projection. We further demonstrate that the matched backprojection operator drastically improves the convergence rate of iterative 3D reconstruction compared to the case where a backprojection based on heuristic weighting is used. In addition, we show that the 3D reconstruction is of better quality.

Place, publisher, year, edition, pages
Cambridge University Press, 2015. Vol. 21, no 3, 725-738 p.
Keyword [en]
STEM, tomography, 3D, focal series, iterative reconstruction, backprojection, depth of field
National Category
Computational Mathematics Other Physics Topics
Research subject
Materials Science and Engineering; Mathematics
URN: urn:nbn:se:kth:diva-167055DOI: 10.1017/S1431927615000525ISI: 000358836400020ScopusID: 2-s2.0-84936891955OAI: diva2:813013

QC 20150615

Available from: 2015-05-21 Created: 2015-05-21 Last updated: 2015-08-27Bibliographically approved

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Kohr, Holger
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