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Impact of hot carrier stress on the defect density and mobility in double-gated graphene field-effect transistors
KTH, School of Information and Communication Technology (ICT), Integrated Devices and Circuits.ORCID iD: 0000-0003-4637-8001
KTH, School of Information and Communication Technology (ICT), Integrated Devices and Circuits.ORCID iD: 0000-0003-1234-6060
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2015 (English)In: EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, 2015, 81-84 p.Conference paper, Published paper (Refereed)
Abstract [en]

We study the impact of hot-carrier degradation (HCD) on the performance of graphene field-effect transistors (GFETs) for different polarities of HC and bias stress. Our results show that the impact of HCD consists in a change of both charged defect density and carrier mobility. At the same time, the mobility degradation agrees with an attractive/repulsive scattering asymmetry and can be understood based on the analysis of the defect density variation.

Place, publisher, year, edition, pages
2015. 81-84 p.
Keyword [en]
Carrier mobility, Defect density, Defects, Graphene, Hot carriers, Bias stress, Charged defect density, Density variations, Graphene field effect transistor (GFETs), Graphene field-effect transistors, Hot carrier degradation, Hot carrier stress, Mobility degradation, Field effect transistors
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-168326DOI: 10.1109/ULIS.2015.7063778ISI: 000380427400021Scopus ID: 2-s2.0-84926435163ISBN: 9781479969111 (print)OAI: oai:DiVA.org:kth-168326DiVA: diva2:818327
Conference
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2015, 26 January 2015 through 28 January 2015
Note

QC 20150608

Available from: 2015-06-08 Created: 2015-06-02 Last updated: 2016-09-02Bibliographically approved

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Vaziri, Sam

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Smith, Anderson D.Vaziri, SamÖstling, Mikael
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CiteExportLink to record
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Citation style
  • apa
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  • modern-language-association-8th-edition
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  • de-DE
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  • fi-FI
  • nn-NO
  • nn-NB
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  • Other locale
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Output format
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