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A Network-Level Solution for Fault Detection, Masking, and Tolerance in NoCs
KTH, School of Information and Communication Technology (ICT), Industrial and Medical Electronics.
KTH, School of Information and Communication Technology (ICT), Industrial and Medical Electronics.
KTH, School of Information and Communication Technology (ICT), Industrial and Medical Electronics.
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2015 (English)Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2015.
National Category
Embedded Systems
Identifiers
URN: urn:nbn:se:kth:diva-169446OAI: oai:DiVA.org:kth-169446DiVA: diva2:821172
Conference
PDP 2015, the 23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, Turku, Finland, March 4-6 2015
Note

QC 20150615

Available from: 2015-06-15 Created: 2015-06-15 Last updated: 2015-06-15Bibliographically approved

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Zhang, XiaofanEbrahimi, MasoumehHuang, LetianJantsch, Axel
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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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Language
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