Millimeter-Wave Near-Field Probe Designed for High-Resolution Skin Cancer Diagnosis
2015 (English)In: IEEE transactions on microwave theory and techniques, ISSN 0018-9480, E-ISSN 1557-9670, Vol. 63, no 6, 2050-2059 p.Article in journal (Refereed) Published
This paper presents a detailed technical characterization of a micromachined millimeter-wave near-field probe developed for skin cancer diagnosis. The broadband probe is optimized for frequencies from 90 to 104 GHz and consists of a dielectric- rod waveguide, which is metallized and tapered towards the tip to achieve high resolution by concentrating the electric field in a small sample area. Several probes with different tip sizes were fabricated from high-resistivity silicon by micromachining and were successfully characterized using silicon test samples with geometry- defined tailor-made permittivity. The probes show a high responsivity for samples with permittivities in the range of healthy and cancerous skin tissue at 100 GHz (from 3.2 - j2.3 to 7.2 - j8.0, loss tangent of approximately 1.26). The sensing depth was determined by simulations and measurements from 0.3 to 0.4 mm, which is adapted for detecting early-stage skin tumors before they metastasize. The lateral resolution was determined to 0.2 mm for a tip size of 0.6 x 0.3 mm, which allows for resolving small skin tumors and inhomogeneities within a tumor.
Place, publisher, year, edition, pages
2015. Vol. 63, no 6, 2050-2059 p.
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-170690DOI: 10.1109/TMTT.2015.2428243ISI: 000355930300027ScopusID: 2-s2.0-84958103391OAI: oai:DiVA.org:kth-170690DiVA: diva2:840243
QC 201507072015-07-072015-07-032015-07-07Bibliographically approved