Change search
ReferencesLink to record
Permanent link

Direct link
Private reliability environments for efficient fault-tolerance in CGRAs
KTH, School of Information and Communication Technology (ICT), Electronics and Embedded Systems.ORCID iD: 0000-0003-0565-9376
Show others and affiliations
2014 (English)In: Design automation for embedded systems, ISSN 0929-5585, E-ISSN 1572-8080, Vol. 18, no 3-4, 295-327 p.Article in journal (Refereed) Published
Abstract [en]

In the era of platforms hosting multiple applications with variable reliability needs, worst-case platform-wide fault-tolerance decisions are neither optimal nor desirable. As a solution to this problem, designs commonly employ adaptive fault-tolerance strategies that provide each application with the reliability level actually needed. However, in the CGRA domain, the existing schemes either only allow to shift between different levels of modular redundancy (duplication, triplication, etc.) or protect only a particular region of a device (e.g. configuration memory, computation, or data memory). To complement these strategies, we propose private fault-tolerance environments which, in addition to modular redundancy, also provide low cost sub-modular (e.g. residue mod 3) redundancy capable of handling both permanent and temporary faults in configuration memory, computation, communication, and data memory. In addition, we also present adaptive configuration scrubbing techniques which prevent fault accumulation in the configuration memory. Simulation results using a few selected algorithms (FFT, matrix multiplication, and FIR filter) show that the approach proposed is capable of providing flexible protection with energy overhead ranging from 3.125 % to 107 % for different reliability levels. Synthesis results have confirmed that the proposed architecture reduces the area overhead for self-checking (58 %) and fault-tolerant (7.1 %) versions, compared to the state of the art adaptive reliability techniques.

Place, publisher, year, edition, pages
2014. Vol. 18, no 3-4, 295-327 p.
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
URN: urn:nbn:se:kth:diva-171030DOI: 10.1007/s10617-014-9129-6ISI: 000356451900011ScopusID: 2-s2.0-84931577920OAI: diva2:841329

QC 20150713

Available from: 2015-07-13 Created: 2015-07-13 Last updated: 2015-07-13Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Hemani, AhmedTenhunen, Hannu
By organisation
Electronics and Embedded SystemsIndustrial and Medical Electronics
In the same journal
Design automation for embedded systems
Electrical Engineering, Electronic Engineering, Information Engineering

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Altmetric score

Total: 26 hits
ReferencesLink to record
Permanent link

Direct link