The thickness of native oxides on aluminum alloys and single crystals
2015 (English)In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 349, 826-832 p.Article in journal (Refereed) Published
We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy from the above two methods. In the present contribution the reasons for this discrepancy are discussed. We also address the effect of the substrate type and the presence of water on the resultant oxide thickness.
Place, publisher, year, edition, pages
2015. Vol. 349, 826-832 p.
IdentifiersURN: urn:nbn:se:kth:diva-171245DOI: 10.1016/j.apsusc.2015.05.043ISI: 000357129100109OAI: oai:DiVA.org:kth-171245DiVA: diva2:843369
QC 201507282015-07-282015-07-272015-07-28Bibliographically approved