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Point Defects in Silicon and Silicon-Carbide
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
2001 (English)Doctoral thesis, comprehensive summary (Other scientific)
Place, publisher, year, edition, pages
Kista: Mikroelektronik och informationsteknik , 2001. , 61 p.
Trita-FTE, ISSN 0284-0545 ; 2001:1
Keyword [en]
silicon, silicon carbide, defects, dlts
URN: urn:nbn:se:kth:diva-3133OAI: diva2:8897
Public defence
NR 20140805Available from: 2001-04-27 Created: 2001-04-27Bibliographically approved

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