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A phase-field study of the scaling law in free-standing ferroelectric thin films
KTH, School of Engineering Sciences (SCI), Aeronautical and Vehicle Engineering.
2015 (English)In: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 26, no 50, 505701Article in journal (Refereed) PublishedText
Abstract [en]

The scaling law for ferroelectric stripe domains is investigated in free-standing BaTiO3 and PbTiO3 thin films via phase-field simulations. The results agree with the Kittel law, where the square of the domain width is found to be proportional to the thin film thickness. After being rescaled by the corresponding domain wall thickness, the generalized scaling law is also demonstrated, with the dimensionless scaling constant M estimated to be similar to 3.3 in two ferroelectric materials. Moreover, we predict the effect of the exchange constant which is incorporated in Ginzburg-Landau theory on the equilibrium domain width and the critical thickness of the ferroelectric thin films.

Place, publisher, year, edition, pages
Institute of Physics Publishing (IOPP), 2015. Vol. 26, no 50, 505701
Keyword [en]
ferroelectric thin film, Kittel law, generalized scaling law, phase-field simulation
National Category
Physical Sciences
URN: urn:nbn:se:kth:diva-180486DOI: 10.1088/0957-4484/26/50/505701ISI: 000366717700013ScopusID: 2-s2.0-84948844135OAI: diva2:895675

QC 20160119

Available from: 2016-01-19 Created: 2016-01-14 Last updated: 2016-01-19Bibliographically approved

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Mao, Huina
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