A phase-field study of the scaling law in free-standing ferroelectric thin films
2015 (English)In: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 26, no 50, 505701Article in journal (Refereed) PublishedText
The scaling law for ferroelectric stripe domains is investigated in free-standing BaTiO3 and PbTiO3 thin films via phase-field simulations. The results agree with the Kittel law, where the square of the domain width is found to be proportional to the thin film thickness. After being rescaled by the corresponding domain wall thickness, the generalized scaling law is also demonstrated, with the dimensionless scaling constant M estimated to be similar to 3.3 in two ferroelectric materials. Moreover, we predict the effect of the exchange constant which is incorporated in Ginzburg-Landau theory on the equilibrium domain width and the critical thickness of the ferroelectric thin films.
Place, publisher, year, edition, pages
Institute of Physics Publishing (IOPP), 2015. Vol. 26, no 50, 505701
ferroelectric thin film, Kittel law, generalized scaling law, phase-field simulation
IdentifiersURN: urn:nbn:se:kth:diva-180486DOI: 10.1088/0957-4484/26/50/505701ISI: 000366717700013ScopusID: 2-s2.0-84948844135OAI: oai:DiVA.org:kth-180486DiVA: diva2:895675
QC 201601192016-01-192016-01-142016-01-19Bibliographically approved