X-ray microtomography using correlation of near-field speckles for material characterization
2015 (English)In: Proceedings of the National Academy of Sciences of the United States of America, ISSN 0027-8424, E-ISSN 1091-6490, Vol. 112, no 41, 12569-12573 p.Article in journal (Refereed) PublishedText
Nondestructive microscale investigation of objects is an invaluable tool in life and materials sciences. Currently, such investigation is mainly performed with X-ray laboratory systems, which are based on absorption-contrast imaging and cannot access the information carried by the phase of the X-ray waves. The phase signal is, nevertheless, of great value in X-ray imaging as it is complementary to the absorption information and in general more sensitive to visualize features with small density differences. Synchrotron facilities, which deliver a beam of high brilliance and high coherence, provide the ideal condition to develop such advanced phase-sensitive methods, but their access is limited. Here we show how a small modification of a laboratory setup yields simultaneously quantitative and 3D absorption and phase images of the object. This single-shot method is based on correlation of X-ray near-field speckles and represents a significant broadening of the capabilities of laboratory- based X-ray tomography.
Place, publisher, year, edition, pages
National Academy of Sciences , 2015. Vol. 112, no 41, 12569-12573 p.
Microtomography, Near-field speckles, Phase-contrast imaging, Refractive index measurement, X-ray imaging, chemical analysis, Conference Paper, correlation analysis, image analysis, micro-computed tomography, priority journal, refraction index
IdentifiersURN: urn:nbn:se:kth:diva-181135DOI: 10.1073/pnas.1502828112ScopusID: 2-s2.0-84944200781OAI: oai:DiVA.org:kth-181135DiVA: diva2:903745
QC 201602162016-02-162016-01-292016-09-21Bibliographically approved