Dual control used in series-loaded resonant converter with SiC devices
2015 (English)In: Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, IEEE , 2015, 495-501 p.Conference paper (Refereed)Text
This paper presents the performance of silicon carbide (SiC) switches in a series-loaded resonant (SLR) converter with dual control (DuC). It is shown that the SiC metal oxide-semiconductor field-effect transistor (MOSFET) with DuC increases the overall efficiency of the SLR converter compared to frequency modulation (FM). For the SiC bipolar junction transistors (BJT), the loss reduction with DuC instead of FM is not as dramatic as for the MOSFET case. Regardless of which transistor type used, the switching losses are around 20 % of the total losses at around 25 kHz. With DuC an almost constant switching frequency is used over the full voltage range compared to FM were the switching frequency increases by 13 %. Additionally a reduction of capacitive snubbers is achieved with DuC.
Place, publisher, year, edition, pages
IEEE , 2015. 495-501 p.
MOSFET;bipolar transistors;frequency control;frequency modulation;resonant power convertors;semiconductor switches;silicon compounds;snubbers;wide band gap semiconductors;BJT;DuC;FM;MOSFET;SLR converter;SiC;bipolar junction transistor;capacitive snubber;constant switching frequency;dual control;frequency control;frequency modulation;metal oxide-semiconductor field-effect transistor;series-loaded resonant converter;silicon carbide device;silicon carbide switch;switching loss;Frequency modulation;MOSFET;Silicon carbide;Snubbers;Switching frequency;Switching loss;Voltage control;Capacitive snubbers;Resonant converter control;SiC devices;Soft switching
Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject SRA - Energy
IdentifiersURN: urn:nbn:se:kth:diva-182754DOI: 10.1109/ICPE.2015.7167831ScopusID: 2-s2.0-84961880181OAI: oai:DiVA.org:kth-182754DiVA: diva2:905692
Power Electronics and Applications (EPE’15 ECCE-Europe), 2015 17th European Conference on
QC 201603172016-02-232016-02-232016-03-17Bibliographically approved