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Power-aware online testing of manycore systems in the dark silicon era
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2015 (English)In: Proceedings -Design, Automation and Test in Europe, DATE, IEEE conference proceedings, 2015, 435-440 p.Conference paper, Published paper (Refereed)
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Text
Abstract [en]

Online defect screening techniques to detect runtime faults are becoming a necessity in current and near future technologies. At the same time, due to aggressive technology scaling into the nanometer regime, power consumption is becoming a significant burden. Most of today's chips employ advanced power management features to monitor the power consumption and apply dynamic power budgeting (i.e., capping) accordingly to prevent over-heating of the chip. Given the notable power dissipation of existing testing methods, one needs to efficiently manage the power budget to cover test process of a many-core system in runtime. In this paper, we propose a power-aware online testing method for many-core systems benefiting from advanced power management capabilities. The proposed power-aware method uses non-intrusive online test scheduling strategy to functionally test the cores in their idle period. In addition, we propose a test-aware utilization-oriented runtime mapping technique that considers the utilization of cores and their test criticality in the mapping process. Our extensive experimental results reveal that the proposed power-aware online testing approach can efficiently utilize temporarily free resources and available power budget for the testing purposes, within less than 1% penalty on system throughput for the 16nm technology.

Place, publisher, year, edition, pages
IEEE conference proceedings, 2015. 435-440 p.
Keyword [en]
Dark Silicon, Functional Testing, Many-Core Systems, Online Testing, Power Capping, Budget control, Electric power utilization, Energy management, Mapping, Occupational risks, Online systems, Testing, Dark silicons, Many core, On-line testing, Power management
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering Computer Engineering
Identifiers
URN: urn:nbn:se:kth:diva-181639Scopus ID: 2-s2.0-84945935060ISBN: 9783981537048 (print)OAI: oai:DiVA.org:kth-181639DiVA: diva2:909011
Conference
2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015, 9 March 2015 through 13 March 2015
Note

QC 20160304

Available from: 2016-03-04 Created: 2016-02-02 Last updated: 2016-03-04Bibliographically approved

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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf