Software-based on-chip thermal sensor calibration for DVFS-enabled many-core systems
2015 (English)In: Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Institute of Electrical and Electronics Engineers (IEEE), 2015, 35-40 p.Conference paper (Refereed)Text
Due to increase in power density and temperature gradient in modern chips, multiple thermal sensors are deployed on the chip area to provide realtime temperature feedback for fine-grained dynamic thermal management (DTM) techniques. Thermal sensor accuracy is extremely prone to intra-die process variation and aging phenomena, and its report gradually drifts from the nominal value. This necessitates efficient calibration techniques to be applied before the sensor values are used. In addition, in modern many-core systems which are often enabled with dynamic voltage and frequency scaling (DVFS), thermal sensors located on cores are sensitive to the core's current voltage-frequency (VF) level, meaning that dedicated calibration is needed for each VF level. In this paper, we propose a general-purpose software-based auto-calibration strategy for thermal sensors without using any hardware infrastructures for DVFS-enabled many-core systems. We adopt a 2-point calibration method for calculating the calibration constants of each thermal sensor at each VF level. We demonstrate the efficiency of the proposed calibration strategy on a many-core platform, Intel's Single-chip Cloud Computer (SCC), covering all voltage and frequency combinations on the platform.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2015. 35-40 p.
Intel Single-chip Cloud Computer, Many-Core Systems, Thermal Calibration, Calibration, Cloud computing, Computer architecture, Defects, Distributed computer systems, Dynamic frequency scaling, Fault tolerance, Nanotechnology, Voltage scaling, Calibration techniques, Dynamic thermal management, Dynamic voltage and frequency scaling, Frequency combinations, General purpose software, Many core, Single-chip cloud computers, Temperature control
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-186840DOI: 10.1109/DFT.2015.7315132ScopusID: 2-s2.0-84962792179ISBN: 9781509003129OAI: oai:DiVA.org:kth-186840DiVA: diva2:938107
28th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, 12 October 2015 through 14 October 2015
QC 201606162016-06-162016-05-132016-06-16Bibliographically approved