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On the Assessment of Written Exams and Possible Bias due to Dynamic Rater Effects Emerging from Student Initials and Rater Fatigue
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.ORCID iD: 0000-0003-4740-1832
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.
2016 (English)In: Högre Utbildning, ISSN 2000-7558, E-ISSN 2000-7558, Vol. 6, no 1, 21-30 p.Article in journal (Refereed) Published
Abstract [en]

In this paper the possibility of an existing bias, due to the order (here by the initial letters of the family names) in which the results of the students are judged, was studied. This would constitute of a dynamic rater effect of harshness, or leniency, toward the performance of these students due to rater fatigue. A substantial dataset, consisting of 12 years of written exams, for a course, for 2512 examinees, was mined and the results analyzed. The evidence point to the fact that the assessment procedure does not favor, or disfavor, students with family names having initial letters placed late in the alphabet.

Place, publisher, year, edition, pages
2016. Vol. 6, no 1, 21-30 p.
Keyword [en]
Education, assessment, rater fatigue
National Category
Educational Sciences
Identifiers
URN: urn:nbn:se:kth:diva-190018OAI: oai:DiVA.org:kth-190018DiVA: diva2:950519
Funder
StandUp
Available from: 2016-08-01 Created: 2016-08-01 Last updated: 2016-08-01

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Månsson, DanielNorgren, Martin
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