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Analysis and Experimental Verification of Diameter Attacks in Long Term Evolution Networks
KTH, School of Information and Communication Technology (ICT).
2016 (English)Independent thesis Advanced level (degree of Master (Two Years)), 20 credits / 30 HE creditsStudent thesis
Abstract [en]

In cellular networks, the roaming interconnection was designed when there were only a few trusted parties and security was not a major concern or design criteria. Most of the roaming interconnections today are still based on the decades-old SS7 and the lack of security is being blamed for several vulnerabilities. Recent research indicates that the roaming interconnection has been widely misused for gaining access to the core network. Several attacks have been demonstrated by malicious attackers and other unauthorized entities such as intelligence agencies by exploiting the SS7 signaling protocol. Some operators moved to the more modern LTE (Long Term Evolution) and Diameter Signaling for high-speed data roaming and enhanced security. While LTE offers very high quality and resilience over the air security, it still requires special security capabilities and features to secure the core network against attacks targeting the roaming interconnection. This thesis analyses and identifies attacks that exploit the roaming interconnection and Diameter signaling used in LTE networks. The attacks are analyzed in accordance with the mobile network protocol standards and signaling scenarios. The attacks are also implemented in a test LTE network of a global operator. This thesis also focuses on potential countermeasures to mitigate the identified attacks.

Place, publisher, year, edition, pages
2016. , 69 p.
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
URN: urn:nbn:se:kth:diva-190124OAI: diva2:951619
Subject / course
Electrical Engineering
Educational program
Master of Science -Security and Mobile Computing
Available from: 2016-08-09 Created: 2016-08-09 Last updated: 2016-08-09Bibliographically approved

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Electrical Engineering, Electronic Engineering, Information Engineering

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