Atomic force microscopy to investigate asphalt binders: a state-of-the-art review
2016 (English)In: International Journal on Road Materials and Pavement Design, ISSN 1468-0629, E-ISSN 2164-7402, Vol. 17, no 3, 693-718 p.Article in journal (Refereed) PublishedText
Atomic force microscopy (AFM) is a non-destructive imaging tool, which is capable of qualitative and quantitative surface analysis with sub-nanometer resolution. Simultaneously with the topology at the micro-scale, AFM is capable of acquiring micro-mechanical information such as relative stiffness/Young's modulus, stickiness/adhesion, hardness, energy loss and sample deformation quantitatively. This paper presents an extensive review on the applications of AFM to investigate different physiochemical properties and performances of asphalt binder. AFM techniques and principles, different sample preparation techniques and its effect on observed micro-structures, chemical origin, surface or bulk phenomenon and temperature sensitivity of these micro-structures are also discussed in this paper. All of the studies conducted on this topic clearly indicated that AFM can successfully be utilised as a tool to better understand how the surface morphology and its physicochemical properties are interlinked and related to the binder performances.
Place, publisher, year, edition, pages
Taylor & Francis, 2016. Vol. 17, no 3, 693-718 p.
asphalt, binder, atomic force microscopy, micro-structure, micro-mechanical properties
IdentifiersURN: urn:nbn:se:kth:diva-190642DOI: 10.1080/14680629.2015.1114012ISI: 000379747600010ScopusID: 2-s2.0-84947781620OAI: oai:DiVA.org:kth-190642DiVA: diva2:953576
QC 201608182016-08-182016-08-122016-08-18Bibliographically approved