Synchrotron radiation induced fluorescence spectroscopy of SF6
2005 (English)In: Journal of Physics B: Atomic, Molecular and Optical Physics, ISSN 0953-4075, E-ISSN 1361-6455, Vol. 38, 387- p.Article in journal (Refereed) Published
The fluorescence of gaseous SF6 was investigated after excitation with 25-80eV synchrotron radiation photons. The total UV-Vis-near IR fluorescence yield was recorded and interpreted in terms of inner valence excitations/ionizations and double excitations in SF6. Dispersed fluorescence measurements in the 400-1000 nm spectral range reveal excited S, S+, F and F+ fragments as solely responsible for the emission. The fluorescence intensity of some of the observed atomic transitions was monitored as a function of the excitation energy. Single, double and triple excitations as well as direct ionizations and shake-ups are proposed as the triggering processes responsible for the creation of the emitting fragments.
Place, publisher, year, edition, pages
2005. Vol. 38, 387- p.
threshold photoelectron-spectroscopy, electron-impact, sulfur-hexafluoride, vacuum-ultraviolet, cross-sections, inner-valence, energy, shell, photoabsorption, fragmentation
Atom and Molecular Physics and Optics
IdentifiersURN: urn:nbn:se:kth:diva-5537DOI: 10.1088/0953-4075/38/4/006ISI: 000228249700007ScopusID: 2-s2.0-14544275080OAI: oai:DiVA.org:kth-5537DiVA: diva2:9934
QC 201009102006-04-052006-04-052010-09-10Bibliographically approved