Change search
Refine search result
1 - 4 of 4
CiteExportLink to result list
Permanent link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Rows per page
  • 5
  • 10
  • 20
  • 50
  • 100
  • 250
Sort
  • Standard (Relevance)
  • Author A-Ö
  • Author Ö-A
  • Title A-Ö
  • Title Ö-A
  • Publication type A-Ö
  • Publication type Ö-A
  • Issued (Oldest first)
  • Issued (Newest first)
  • Created (Oldest first)
  • Created (Newest first)
  • Last updated (Oldest first)
  • Last updated (Newest first)
  • Disputation date (earliest first)
  • Disputation date (latest first)
  • Standard (Relevance)
  • Author A-Ö
  • Author Ö-A
  • Title A-Ö
  • Title Ö-A
  • Publication type A-Ö
  • Publication type Ö-A
  • Issued (Oldest first)
  • Issued (Newest first)
  • Created (Oldest first)
  • Created (Newest first)
  • Last updated (Oldest first)
  • Last updated (Newest first)
  • Disputation date (earliest first)
  • Disputation date (latest first)
Select
The maximal number of hits you can export is 250. When you want to export more records please use the Create feeds function.
  • 1.
    Badel, Xavier
    et al.
    KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
    Kumar, R. T. R.
    Atomic Physics Division, Stockholm University.
    Kleinmann, P.
    LENAC, Univ. Claude Bernard Lyon-I, Villeurbanne.
    Linnros, Jan
    KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
    Formation of ordered pore arrays at the nanoscale by electrochemical etching of n-type silicon2004In: Superlattices and Microstructures, ISSN 0749-6036, E-ISSN 1096-3677, Vol. 36, no 1/3, p. 245-254Article in journal (Refereed)
    Abstract [en]

    Electrochemical etching has been studied to structure n-type silicon substrates at the nanoscale. In this work, well-ordered pore arrays with diameters in the range of 150-500 nm and depths up to 50 mum have been fabricated. The pores were successfully formed by anodic etching in (100)oriented n-type silicon wafers of low-resistivity, typically 1 Omegacm, using aqueous hydrofluoric acid solutions. The lithographic step was performed in a thermally grown oxide using a stepper and dry oxide etching technique. Two types of oxide openings and pitch sizes were tested. The smallest oxide opening realised at this stage was 0.5 mum for a pitch of 1 mum. Stable pore formation was obtained and the smallest pore size obtained was about 200 nm with an aspect ratio close to 100.

  • 2. Berman, G. P.
    et al.
    Borgonovi, F.
    Rinkevicius, Zilvinas
    KTH, Superseded Departments, Biotechnology.
    Tsifrinovich, V. I.
    Single-spin measurements for quantum computation using magnetic resonance force microscopy2003In: Superlattices and Microstructures, ISSN 0749-6036, E-ISSN 1096-3677, Vol. 34, no 06-mar, p. 509-511Article in journal (Refereed)
    Abstract [en]

    The quantum theory of a single-spin measurement using magnetic resonance force microscopy is presented. We use an oscillating cantilever-driven adiabatic reversal technique. The frequency shift of the cantilever vibrations is estimated. We show that the frequency shift causes the formation of a Schrodinger cat state for the cantilever. The interaction between the cantilever and the environment quickly destroys the coherence between the two cantilever trajectories. It is shown that using partial adiabatic reversals one can obtain a significant increase in the frequency shift. We discuss the possibility of sub-magneton spin density detection in molecules using magnetic resonance force microscopy.

  • 3. Borseth, T. M.
    et al.
    Christensen, J. S.
    Maknys, K.
    Hallén, Anders.
    KTH, School of Information and Communication Technology (ICT), Microelectronics and Information Technology, IMIT.
    Svensson, B. G.
    Kuznetsov, A. Y.
    Annealing study of Sb+ and Al+ ion-implanted ZnO2005In: Superlattices and Microstructures, ISSN 0749-6036, E-ISSN 1096-3677, Vol. 38, no 4-6, p. 464-471Article in journal (Refereed)
    Abstract [en]

    In this work we have studied diffusion and electrical activation in Al+ and Sb+ implanted ZnO samples using secondary ion mass spectrometry (SIMS), scanning spreading resistance microscopy (SSRM) and scanning capacitance microscopy (SCM). The samples were hydrothermally grown and post-implant annealing was performed at 800, 900 and 1000 degrees C in pure oxygen atmosphere, After each annealing step the samples were characterized with SSRM/SCM and SIMS. The thermal treatments did not induce any significant impurity redistribution as measured by SIMS, while electrical compensation is observed by SSRM/SCM for the Sb-implanted sample yielding less n-doping than in the as-grown samples. In the Al-implanted samples, an increase in carrier concentration is observed; we ascribe this to Al-related donors and possibly interstitial lithium, a common residual impurity in the samples that have been shown to be very mobile by SIMS.

  • 4. Touati, Baligh
    et al.
    Gassoumi, Abdelaziz
    Dobryden, Illia
    KTH, School of Chemical Science and Engineering (CHE), Chemistry, Surface and Corrosion Science. Luleå Univ Technol.
    Natile, Marta Maria
    Vomiero, Alberto
    Turki, Najoua Kamoun
    Engineering of electronic and optical properties of PbS thin films via Cu doping2016In: Superlattices and Microstructures, ISSN 0749-6036, E-ISSN 1096-3677, Vol. 97, p. 519-528Article in journal (Refereed)
    Abstract [en]

    Copper-doped PbS polycrystalline thin films were deposited by chemical bath deposition by adding small amount of Cu (y(solution) = [Cu2+]/[Pb2+]) between 0.5 and 2 at%. The composition, structure, morphology, optical and electrical properties of the films were investigated by means of X-ray diffraction (XRD), Rutherford backscattering spectrometry (RBS), atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray photoemission spectroscopy (XPS), UV-visible near infrared (UV-Vis-NIR) spectrophotometry and Hall effect measurements. The XRD studies showed that the undoped films have PbS face centered cubic structure with (111) preferential orientation, while preferential orientation changes to (200) plane with increasing Cu doping concentration. The AFM and SEM measurements indicated that the film surfaces consisted of nanosized grains with pyramidal shape. Optical band gap was blue shifted from 0.72 eV to 1.69 eV with the increase in Cu doping concentration. The film obtained with the [Cu2+]/[Pb2+] ratio equal to 1.5 at% Cu showed the minimum resistivity of 0.16 Omega cm at room temperature and optimum value of optical band gap close to 1.5 eV. 1.5 at% Cu-doped PbS thin films exhibit the best optical and electrical properties, suitable for solar cells applications.

1 - 4 of 4
CiteExportLink to result list
Permanent link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf