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  • 1. Hoppe, R.
    et al.
    Meier, V.
    Patommel, J.
    Seiboth, F.
    Lee, H. J.
    Nagler, B.
    Galtier, E. C.
    Arnold, B.
    Zastrau, U.
    Hastings, J.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Schroer, C. G.
    Schropp, A.
    Full characterization of a focused wavefield with sub 100 nm resolution2013Inngår i: Advances In X-Ray Free-Electron Lasers II: Instrumentation, SPIE - International Society for Optical Engineering, 2013, s. 87780G-Konferansepaper (Fagfellevurdert)
    Abstract [en]

    A hard x-ray free-electron laser (XFEL) provides an x-ray source with an extraordinary high peak-brilliance, a time structure with extremely short pulses and with a large degree of coherence, opening the door to new scientific fields. Many XFEL experiments require the x-ray beam to be focused to nanometer dimensions or, at least, benefit from such a focused beam. A detailed knowledge about the illuminating beam helps to interpret the measurements or is even inevitable to make full use of the focused beam. In this paper we report on focusing an XFEL beam to a transverse size of 125nm and how we applied ptychographic imaging to measure the complex wavefield in the focal plane in terms of phase and amplitude. Propagating the wavefield back and forth we are able to reconstruct the full caustic of the beam, revealing aberrations of the nano-focusing optic. By this method we not only obtain the averaged illumination but also the wavefield of individual XFEL pulses.

  • 2.
    Nilsson, Daniel
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Holmberg, Anders
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Schropp, A.
    Patommel, J.
    Hoppe, R.
    Seiboth, F.
    Meier, V.
    Schroer, C. G.
    Galtier, E.
    Nagler, B.
    Lee, H. J.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser2012Inngår i: Optics Letters, ISSN 0146-9592, E-ISSN 1539-4794, Vol. 37, nr 24, s. 5046-5048Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    We demonstrate the use of the classical Ronchi test to characterize aberrations in focusing optics at a hard x-ray free-electron laser. A grating is placed close to the focus and the interference between the different orders after the grating is observed in the far field. Any aberrations in the beam or the optics will distort the interference fringes. The methodis simple to implement and can provide single-shot information about the focusing quality. We used the Ronchi test to measure the aberrations in a nanofocusing Fresnel zone plate at the Linac Coherent Light Source at 8.194 keV.

  • 3.
    Nilsson, Daniel
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Reinspach, Julia
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Holmberg, Anders
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Sinn, H.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Thermal stability of tungsten zone plates for focusing hard x-ray free-electron laser radiation2012Inngår i: New Journal of Physics, ISSN 1367-2630, E-ISSN 1367-2630, Vol. 14, s. 043010-Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    Diffractive Fresnel zone plates made of tungsten show great promise for focusing hard x-ray free-electron laser (XFEL) radiation to very small spot sizes. However, they have to withstand the high-intensity pulses of the beam without being damaged. This might be problematic since each XFEL pulse will create a significant temperature increase in the zone plate nanostructures and it is therefore crucial that the optics are thermally stable, even for a large number of pulses. Here we have studied the thermal stability of tungsten zone-platelike nanostructures on diamond substrates using a pulsed Nd:YAG laser which creates temperature profiles similar to those expected from XFEL pulses. We found that the structures remained intact up to a laser fluence of 100 mJ cm(-2), corresponding to a 6 keV x-ray fluence of 590 mJ cm-2, which is above typical fluence levels in an unfocused XFEL beam. We have also performed an initial damage experiment at the LCLS hard XFEL facility at SLAC National Accelerator Laboratory, where a tungsten zone plate on a diamond substrate was exposed to 105 pulses of 6 keV x-rays with a pulse fluence of 350 mJ cm-2 without any damage occurring.

  • 4.
    Reinspach, Julia
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Holmberg, Anders
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Twelve nanometer half-pitch W–Cr–HSQ trilayer process for soft x-ray tungsten zone plates2011Inngår i: Journal of Vacuum Science & Technology B, ISSN 1071-1023, E-ISSN 1520-8567, Vol. 29, nr 6, s. 06FG02-1-06FG02-4Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    The authors describe a new W–Cr–HSQ trilayer nanofabrication process for high-resolution and high-diffraction-efficiency soft x-ray W zone-plate lenses. High-resolution HSQ gratings were first fabricated by electron-beam lithography and high-contrast development in a NaCl/NaOH solution. The HSQ pattern was then transferred to the Cr layer by RIE with Cl2/O2, and subsequently to the W layer by cryogenic RIE with SF6/O2. The anisotropy of the W etch as a function of substrate temperature was investigated, and the best etch profile was achieved at −50 °C. Using this optimized process, W gratings with half-pitches down to 12 nm and a height of 90 nm were fabricated. For a zone plate with corresponding parameters, this would result in a theoretical diffraction efficiency of 9.6% (at λ = 2.48 nm), twice as high as has been reported previously.

  • 5. Schroer, Christian G
    et al.
    Brack, Florian-Emanuel
    Brendler, Roman
    Hönig, Susanne
    Hoppe, Robert
    Patommel, Jens
    Ritter, Stephan
    Scholz, Maria
    Schropp, Andreas
    Seiboth, Frank
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Rahomäki, Jussi
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Reinhardt, Juliane
    Falkenberg, Gerald
    Hard x-ray nanofocusing with refractive x-ray optics: full beam characterization by ptychographic imaging2013Inngår i: Proceedings of SPIE, 2013, s. 884807-Konferansepaper (Fagfellevurdert)
    Abstract [en]

    Hard x-ray scanning microscopy relies on small and intensive nanobeams. Refractive x-ray lenses are well suited to generate hard x-ray beams with lateral dimensions of 100 nm and below. The diffraction limited beam size of refractive x-ray lenses mainly depends on the focal length and the attenuation inside the lens material. The numerical aperture of refractive lenses scales with the inverse square root of the focal length until it reaches the critical angle of total reflection. We have used nanofocusing refractive x-ray lenses made of silicon to focus hard x-rays at 8 and 20 keV to (sub-)100 nm dimensions. Using ptychographic scanning coherent diffraction imaging we have characterized these nanobeams with high accuracy and sensitivity, measuring the full complex wave field in the focus. This gives access to the full caustic and aberrations of the x-ray optics. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

  • 6. Schropp, Andreas
    et al.
    Hoppe, Robert
    Meier, Vivienne
    Patommel, Jens
    Seiboth, Frank
    Lee, Hae Ja
    Nagler, Bob
    Galtier, Eric C.
    Arnold, Brice
    Zastrau, Ulf
    Hastings, Jerome B.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Schroer, Christian G.
    Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging2013Inngår i: Scientific Reports, ISSN 2045-2322, E-ISSN 2045-2322, Vol. 3, s. 1633-Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    The emergence of hard X-ray free electron lasers (XFELs) enables new insights into many fields of science. These new sources provide short, highly intense, and coherent X-ray pulses. In a variety of scientific applications these pulses need to be strongly focused. In this article, we demonstrate focusing of hard X-ray FEL pulses to 125 nmusing refractive x-ray optics. For a quantitative analysis of most experiments, the wave field or at least the intensity distribution illuminating the sample is needed. We report on the full characterization of a nanofocused XFEL beam by ptychographic imaging, giving access to the complex wave field in the nanofocus. From these data, we obtain the full caustic of the beam, identify the aberrations of the optic, and determine the wave field for individual pulses. This information is for example crucial for high-resolution imaging, creating matter in extreme conditions, and nonlinear x-ray optics.

  • 7. Schropp, Andreas
    et al.
    Hoppe, Robert
    Patommel, Jens
    Seiboth, Frank
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Lee, Hae Ja
    Nagler, Bob
    Galtier, Eric C
    Zastrau, Ulf
    Arnold, Brice
    Heimann, Philip
    Hastings, Jerome B
    Schroer, Christian G
    Scanning coherent x-ray microscopy as a tool for XFEL nanobeam characterization2013Inngår i: Proceedings of SPIE: The International Society for Optical Engineering, 2013Konferansepaper (Fagfellevurdert)
    Abstract [en]

    During the last years, scanning coherent x-ray microscopy, also called ptychography, has revolutionized nanobeam characterization at third generation x-ray sources. The method yields the complete information on the complex valued, nanofocused wave field with high spatial resolution. In an experiment carried out at the Matter in Extreme Conditions (MEC) instrument at the Linac Coherent Light Source (LCLS) we successfully applied the method to an attenuated nanofocused XFEL beam with a size of 180(h) × 150(v) nm2 (FWHM) in horizontal (h) and vertical direction (v), respectively. It was created by a set of 20 beryllium compound refractive lenses (Be-CRLs). By using a fast detector (CSPAD) to record the diffraction patterns and a fast implementation of the phase retrieval code running on a graphics processing unit (GPU), the applicability of the method as a real-time XFEL nanobeam diagnostic is highlighted.

  • 8. Seiboth, F.
    et al.
    Schropp, A.
    Hoppe, R.
    Meier, V.
    Patommel, J.
    Lee, H. J.
    Nagler, B.
    Galtier, E. C.
    Arnold, B.
    Zastrau, U.
    Hastings, J. B.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Schroer, C. G.
    Focusing XFEL SASE pulses by rotationally parabolic refractive x-ray lenses2014Inngår i: Journal of Physics, Conference Series, ISSN 1742-6588, E-ISSN 1742-6596, Vol. 499, nr 1, s. 012004-Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    Using rotationally parabolic refractive x-ray lenses made of beryllium, we focus hard x-ray free-electron laser pulses of the Linac Coherent Light Source (LCLS) down to a spot size in the 100 nm range. We demonstrated efficient nanofocusing and characterized the nanofocused wave field by ptychographic imaging [A. Schropp, et al., Sci. Rep. 3, 1633 (2013)] in the case of monochromatic LCLS pulses produced by a crystal monochromator that decreases the LCLS bandwidth down to ΔE/E 1.4 · 10-4. The full spectrum of LCLS pulses generated by self-amplified spontaneous emission (SASE), however, fluctuates and has a typical bandwidth of a few per mille (ΔE/E 2 · 10-3). Due to the dispersion in the lens material, a polychromatic nanobeam generated by refractive x-ray lenses is affected by chromatic aberration. After reviewing the chromaticity of refractive x-ray lenses, we discuss the influence of increased bandwidth on the quality of a nanofocused SASE pulse.

  • 9.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Nanofabrication of Zone Plates for Hard X-Ray Free-Electron Lasers2015Doktoravhandling, med artikler (Annet vitenskapelig)
    Abstract [en]

    This Thesis describes the development of hard X-ray zone plates intended for focusing radiation at X-ray free-electron lasers (XFELs). XFELs provide unprecedented brightness and zone plates which are put in the intense X-ray beam are at risk of being damaged. Therefore, it is crucial to perform damage tests in order to design zone plates which can survive the XFEL beam.

    Zone plates are diffractive nanofocusing optics and are regularly used at high brightness synchrotron beamlines in the soft and hard X-ray regime. The resolution of a zone plate is proportional to its outermost zonewidth and thus depends on the smallest feature that can be fabricated. State-of-the-art nanofabrication processes developed for zone plates are able to produce zonewidths down to 10 nm. However, for hard X-rays, the zone plates need to be of sufficient thickness to efficiently focus the radiation. Thus, the limit in the fabrication of hard X-ray zone plates lies in the high aspect-ratios. This Thesis describes two processes developed for high aspect-ratio nanostructuring. The first process uses tungsten as diffractive material. Aspect-ratios up to 1:15 have been accomplished. Furthermore, a mounting method of a central stop directly on the zone plate is also presented. The other fabrication process uses diamond, in which aspect-ratios of 1:30 have been demonstrated. Both processes rely on thin-film deposition techniques, electron-beam lithography, and reactive ion etching. Thanks to the materials’ excellent thermal properties these types of zone plates should be suitable for XFEL applications. Tungsten and diamond diffractive optics have been tested at an XFEL at Stanford (LCLS), and damage investigations were performed in order to determine the maximum fluence that could be imposed on the optics before degradation occured. The conclusion of these damage tests is that tungsten and diamond diffractive optics can survive the XFEL beam and could potentially be used in beamline experiments relying on nanofocused X-ray beams. Finally in this Thesis, characterization of two zone plates using an interferometer is presented, where it is also shown that the interferometric method can be used to pin-point beamline instabilities.

    Fulltekst (pdf)
    Thesis
  • 10.
    Uhlén, Fredrik
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Lindqvist, Sandra
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Reinspach, Julia
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Holmberg, Anders
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    New diamond nanofabrication process for hard x-ray zone plates2011Inngår i: Journal of Vacuum Science & Technology B, ISSN 1071-1023, E-ISSN 1520-8567, Vol. 29, nr 6, s. 06FG03-1-06FG03-4Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    The authors report on a new tungsten-hardmask-based diamond dry-etch process for fabricating diamond zone plate lenses with a high aspect ratio. The tungsten hardmask is structured by electron-beam lithography, together with Cl2/O2 and SF6/O2 reactive ion etching in a trilayer resist-chromium-tungsten stack. The underlying diamond is then etched in an O2 plasma. The authors demonstrate excellent-quality diamond gratings with half-pitch down to 80 nm and a height of 2.6 μm, as well as zone plates with a 75 μm diameter and 100 nm outermost zone width. The diffraction efficiency of the zone plates is measured to 14.5% at an 8 keV x-ray energy, and the imaging properties were investigated in a scanning microscope arrangement showing sub-100-nm resolution. The imaging and thermal properties of these lenses make them suitable for use with high-brightness x-ray free-electron laser sources.

  • 11.
    Uhlén, Fredrik
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Holmberg, Anders
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Schroer, C. G.
    Seiboth, F.
    Patommel, J.
    Meier, V.
    Hoppe, R.
    Schropp, A.
    Lee, H. J.
    Nagler, B.
    Galtier, E.
    Krzywinski, J.
    Sinn, H.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser2013Inngår i: Optics Express, ISSN 1094-4087, E-ISSN 1094-4087, Vol. 21, nr 7, s. 8051-8061Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    Focusing hard x-ray free-electron laser radiation with extremely high fluence sets stringent demands on the x-ray optics. Any material placed in an intense x-ray beam is at risk of being damaged. Therefore, it is crucial to find the damage thresholds for focusing optics. In this paper we report experimental results of exposing tungsten and diamond diffractive optics to a prefocused 8.2 keV free-electron laser beam in order to find damage threshold fluence levels. Tungsten nanostructures were damaged at fluence levels above 500 mJ/cm(2). The damage was of mechanical character, caused by thermal stress variations. Diamond nanostructures were affected at a fluence of 59 000 mJ/cm(2). For fluence levels above this, a significant graphitization process was initiated. Scanning Electron Microscopy (SEM) and mu-Raman analysis were used to analyze exposed nanostructures.

  • 12.
    Uhlén, Fredrik
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Rahomäki, Jussi
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Belova, Liubov
    KTH, Skolan för industriell teknik och management (ITM), Materialvetenskap, Teknisk materialfysik.
    Schroer, Christian G.
    Seiboth, Frank
    Holmberg, Anders
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Nanofabrication of tungsten zone plates with integrated platinum central stop for hard X-ray applications2014Inngår i: Microelectronic Engineering, ISSN 0167-9317, E-ISSN 1873-5568, Vol. 116, s. 40-43Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    We present a nanofabrication process for producing tungsten zone plates used in hard X-ray applications including a method of integrating a high-energy absorbing central stop with the optic. Tungsten zone plates are structured with electron-beam lithography and subsequent reactive ion etching. The central stop originates from a platinum wire. It is cut to dimension by focused ion beam etching, and afterwards attached to the zone plate center using ion beam induced deposition of platinum. A zone plate with integrated central stop will simplify alignment in hard X-ray scanning microscope arrangements where the 0th order light must be eliminated. The focusing performance of the zone plate device was investigated by scanning coherent diffraction imaging (ptychography) at 8 keV photon energy. We could demonstrate a diffraction-limited focus size of 53 nm diameter full-width-at-half-maximum. Tungsten zone plates with integrated central stops show promising results for use in hard X-ray microscopes at high-brightness facilities.

  • 13.
    Uhlén, Fredrik
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Rahomäki, Jussi
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Seiboth, Frank
    Sanz, Claude
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Wagner, Ulrich
    Rau, Christoph
    Schroer, Christian G.
    Vogt, Ulrich
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Ronchi test for characterization of X-ray nanofocusing optics and beamlines2014Inngår i: Journal of Synchrotron Radiation, ISSN 0909-0495, E-ISSN 1600-5775, Vol. 21, s. 1105-1109Artikkel i tidsskrift (Fagfellevurdert)
    Abstract [en]

    A Ronchi interferometer for hard X-rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X-ray optics: a compound refractive lens and a zone plate.

  • 14.
    Vogt, Ulrich
    et al.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Reinspach, Julia
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Uhlén, Fredrik
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Nilsson, Daniel
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Hertz, Hans M.
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Holmberg, Anders
    KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
    Diffractive optics for laboratory sources to free electron lasers2013Inngår i: 11th International Conference On X-Ray Microscopy (XRM2012), Institute of Physics (IOP), 2013, Vol. 463, nr 1, s. 012001-Konferansepaper (Fagfellevurdert)
    Abstract [en]

    In this contribution we present our recent results in the field of diffractive optics for both soft and hard x-ray radiation, and for laboratory sources to x-ray free electron lasers (XFEL). We developed a laboratory soft x-ray microscope that uses in-house produced zone plate optics as high-resolution objectives. We continuously try to improve these optics, both in terms of efficiency and resolution. Our latest development is the manufacturing of tungsten soft x-ray zone plates with outermost zone widths of 12 nm and 90 nm high structures. For hard x-rays, we investigated the possibility to use metal zone plates on a diamond substrate for nano-focusing of the European X-ray Free Electron Laser. The simulations show that the heat conduction is efficient enough to keep a zone plate well below melting temperature. However, metal zone plates will experience large and rapid temperature fluctuations of several hundred Kelvin that might prove fatal. To test this, we manufactured tungsten on diamond prototype zone plates and exposed them to radiation from the LCLS XFEL. Results show that metal zone plates can survive the XFEL beam.

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