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2015 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 91, no 8, article id 085311Article in journal (Refereed) Published
Abstract [en]
Several scientific issues concerning the latest generation read heads for magnetic storage devices, based on CoFeB/MgO/CoFeBmagnetic tunnel junctions (MTJs) are known to be controversial, including such fundamental questions as to the behavior and the role of B in optimizing the physical properties of these devices. Quantitatively establishing the internal structures of several such devices with different annealing conditions using hard x-ray photoelectron spectroscopy, we resolve these controversies and establish that the B diffusion is controlled by the capping Ta layer, though Ta is physically separated from the layer with B by several nanometers. While explaining this unusual phenomenon, we also provide insight into why the tunneling magnetoresistance (TMR) is optimized at an intermediate annealing temperature, relating it to B diffusion, coupled with our studies based on x-ray diffraction and magnetic studies.
National Category
Physical Sciences
Identifiers
urn:nbn:se:kth:diva-163999 (URN)10.1103/PhysRevB.91.085311 (DOI)000350319200013 ()2-s2.0-84924081350 (Scopus ID)
Funder
The Swedish Foundation for International Cooperation in Research and Higher Education (STINT)
Note
QC 20150507
2015-05-072015-04-132024-03-15Bibliographically approved