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Publications (10 of 367) Show all publications
Bhadoria, S., Ye, T., Dijkhuizen, F. & Nee, H.-P. (2025). A New Power Flow Controller for HVDC Grids and its Protection against Ground Faults. In: 2025 IEEE Energy Conversion Congress and Exposition Asia: Shaping a Greener Future with Power Electronics, ECCE-Asia 2025: . Paper presented at 17th IEEE Energy Conversion Congress and Exposition Asia, ECCE-Asia 2025, Bengaluru, India, May 11-14, 2025. Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>A New Power Flow Controller for HVDC Grids and its Protection against Ground Faults
2025 (English)In: 2025 IEEE Energy Conversion Congress and Exposition Asia: Shaping a Greener Future with Power Electronics, ECCE-Asia 2025, Institute of Electrical and Electronics Engineers (IEEE) , 2025Conference paper, Published paper (Refereed)
Abstract [en]

A power flow controller (PFC) may be needed to control the currents and power transmitted in the transmission lines in a highly meshed HVDC system. The paper presents a new and simple topology for series interline PFC for a simple 3 terminal HVDC system. Interline PFCs do not need an external power supply to change the current distribution in the HVDC system. The performance of the proposed PFC during steady state operation and ground faults is analyzed in detail using PLECS software. A protection circuit and its design aspects are also proposed for ground faults on one of the cables.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2025
Keywords
ground fault, HVDC, Interline converter, Power Flow controllers, protection
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-370823 (URN)10.1109/ECCE-Asia63110.2025.11112492 (DOI)2-s2.0-105015675104 (Scopus ID)
Conference
17th IEEE Energy Conversion Congress and Exposition Asia, ECCE-Asia 2025, Bengaluru, India, May 11-14, 2025
Note

Part of ISBN 9798331518868

QC 20251003

Available from: 2025-10-03 Created: 2025-10-03 Last updated: 2025-10-03Bibliographically approved
Bhadoria, S., Ye, T., Dijkhuizen, F. & Nee, H.-P. (2025). A New PowerFlow Controller for HVDC Grids and its Protection against GroundFaults. In: : . Paper presented at ECCE Asia 2025, Bengaluru, India, May 11–14, 2025.
Open this publication in new window or tab >>A New PowerFlow Controller for HVDC Grids and its Protection against GroundFaults
2025 (English)Conference paper, Published paper (Refereed)
National Category
Electrical Engineering, Electronic Engineering, Information Engineering Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-361544 (URN)
Conference
ECCE Asia 2025, Bengaluru, India, May 11–14, 2025
Available from: 2025-03-21 Created: 2025-03-21 Last updated: 2025-03-30Bibliographically approved
Abbas, K., Gandla, L. P., Sarmast Ghahfarokhi, S., Kostov, K. S. & Nee, H.-P. (2025). Autonomous Gate Drivers for TCM-Based Soft-Switched Converters: Design Approach and Experimental Validation. IEEE Transactions on Industrial Electronics
Open this publication in new window or tab >>Autonomous Gate Drivers for TCM-Based Soft-Switched Converters: Design Approach and Experimental Validation
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2025 (English)In: IEEE Transactions on Industrial Electronics, ISSN 0278-0046, E-ISSN 1557-9948Article in journal (Other academic) Epub ahead of print
Abstract [en]

This paper presents a soft-switched buck converter using Autonomous Gate Drivers (AGDs) for power electronic converters. Operating at a 400 V DC-link, typical of Electric Vehicles (EVs) and industrial systems, the converter achieves Zero Voltage Switching (ZVS) during turn-on and turn-off via AGD circuitry and optimized snubber capacitance. Operating in Triangular Current Mode (TCM), the converter utilizes inductor current ripple to enable ZVS. Experimental results confirm reliable soft-switching and suppression of voltage overshoot under realistic conditions. While the validation uses a buck converter, the proposed AGDs are directly applicable to more complex converters, including three-phase inverters with sinusoidal reference currents, relevant to EVs, renewable energy, and industrial drives. This work demonstrates a scalable solution for reducing switching losses and improving efficiency in advanced high-voltage converters.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2025
Keywords
Autonomous gate driver (AGD), electric vehicles (EVs), zero-voltage switching (ZVS), soft switching, triangular current mode (TCM), snubber capacitance, high-efficiency power conversion, SiC MOSFETs, traction inverter
National Category
Engineering and Technology
Research subject
Electrical Engineering
Identifiers
urn:nbn:se:kth:diva-370475 (URN)
Funder
Swedish Energy Agency, 44833-1/P2017-90020
Available from: 2025-09-25 Created: 2025-09-25 Last updated: 2025-09-26
Abbas, K., Chatterjee, B., Rey, A. C., Sarmast Ghahfarokhi, S., Ayaz, E., Hiller, M. & Nee, H.-P. (2025). Design of a High-Power Filter Inductor for Variable-Switching-Frequency TCM-Based ZVS Inverters in EV Drive Systems. IEEE Open Journal of Power Electronics
Open this publication in new window or tab >>Design of a High-Power Filter Inductor for Variable-Switching-Frequency TCM-Based ZVS Inverters in EV Drive Systems
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2025 (English)In: IEEE Open Journal of Power Electronics, ISSN 2644-1314Article in journal, News item (Refereed) Submitted
Abstract [en]

The utilization of soft-switching inverters is essential for achieving high efficiency and low electromagnetic interference (EMI) in electric vehicle (EV) drive systems. However, inductor design for such converters presents significant challenges. In triangular current mode (TCM)-based zero voltage switching (ZVS) inverters, inductors experience large current ripple and variable switching frequency, leading to excessive core and winding losses. This paper presents a design methodology for a high-power filter inductor specifically suited for TCM-based ZVS inverters. A ferrite pot core was selected, and three winding techniques—Litz wire, copper foil, and solid copper wire—were evaluated. The inductance of the three inductors was determined both experimentally and via simulation using FEMM and ANSYS, while power losses were estimated using FEM-based simulations in ANSYS. Experimental determination of 3C91 core loss coefficients was also performed. The optimal configuration required two parallel inductors per phase, resulting in a final three-phase inverter design with six inductors, each 57 mm high and 66 mm in diameter. By integrating experimental measurements with simulation-based loss estimation, the proposed approach reduces core and copper losses, improves thermal management, and enhances power density, making it suitable for next-generation EV powertrains and renewable energy conversion systems.

Place, publisher, year, edition, pages
Piscataway, NJ, USA: IEEE, 2025
National Category
Engineering and Technology
Research subject
Electrical Engineering
Identifiers
urn:nbn:se:kth:diva-370482 (URN)
Funder
Swedish Energy Agency, 44833-1
Note

QC 20250926

Available from: 2025-09-25 Created: 2025-09-25 Last updated: 2025-09-26Bibliographically approved
Sarmast Ghahfarokhi, S., Singh, B. P., Ayaz, E., Nee, H.-P. & Norrga, S. (2025). Reliability Studies on SiC MOSFET Modules Following a Partial Failure Incident. In: Proceedings - 2025 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2025: . Paper presented at 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2025, Utrecht, Netherlands, Kingdom of the, Apr 6 2025 - Apr 9 2025. Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>Reliability Studies on SiC MOSFET Modules Following a Partial Failure Incident
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2025 (English)In: Proceedings - 2025 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2025, Institute of Electrical and Electronics Engineers (IEEE) , 2025Conference paper, Published paper (Refereed)
Abstract [en]

This study analyzes the sequential failure and remaining useful life (RUL) of a multi-chip power module (MCPM) using finite element (FE) simulation, an empirical lifetime model, and recursive deconvolution. The FE model captures electro-thermal interactions, while the empirical model estimates failure probabilities from power cycling test data. The deconvolution method refines the probability density function of the first failure, providing deeper insights into degradation trends. Results show that the first die in an MCPM can fail significantly earlier than the last, with temperature imbalances contributing to this variation. Despite early failures, the system can continue operating with minor thermal impacts. These findings highlight the need for adaptive failure management and improved thermal design to enhance reliability and system life time.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2025
Keywords
Empirical lifetime model, Finite element analysis, Multichip power module, reliability, Remaining useful life prediction
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-368606 (URN)10.1109/EuroSimE65125.2025.11006626 (DOI)2-s2.0-105007417452 (Scopus ID)
Conference
26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2025, Utrecht, Netherlands, Kingdom of the, Apr 6 2025 - Apr 9 2025
Note

Part of ISBN 9798350393002

QC 20250822

Available from: 2025-08-22 Created: 2025-08-22 Last updated: 2025-08-22Bibliographically approved
Asoodar, M., Nahalparvari, M. & Nee, H.-P. (2025). Virtual Flux-Based Modulation for Adaptive Stress Alleviation of Degraded Cells in CHB-Based MMCs. In: : . Paper presented at PCIM Europe, Nuremberg, Germany, 6-8 May 2025.
Open this publication in new window or tab >>Virtual Flux-Based Modulation for Adaptive Stress Alleviation of Degraded Cells in CHB-Based MMCs
2025 (English)Conference paper, Poster (with or without abstract) (Refereed)
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-358841 (URN)
Conference
PCIM Europe, Nuremberg, Germany, 6-8 May 2025
Note

QC 20250513

Available from: 2025-01-21 Created: 2025-01-21 Last updated: 2025-05-13Bibliographically approved
Asoodar, M., Nahalparvari, M., Mohanaveeramani, A. & Nee, H.-P. (2025). Virtual Flux-Based Modulation Schemes for Adaptive Stress Reduction of Degraded Submodules in CHB-Based MMCs. In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025: . Paper presented at 2025 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025, Nuremberg, Germany, May 6 2025 - May 8 2025 (pp. 2211-2220). Mesago PCIM GmbH
Open this publication in new window or tab >>Virtual Flux-Based Modulation Schemes for Adaptive Stress Reduction of Degraded Submodules in CHB-Based MMCs
2025 (English)In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025, Mesago PCIM GmbH , 2025, p. 2211-2220Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents an adaptive control scheme for cascaded H-bridge modular multilevel converters that reduces the voltage stress on selected components estimated to have degraded health. The proposed method independently controls the average voltage of each SM according to its estimated state of health. It is shown that the combination of the proposed control system and the virtual flux-based modulation results in minor changes in the quality of the output current while the converter operates with unequal submodule voltages.

Place, publisher, year, edition, pages
Mesago PCIM GmbH, 2025
National Category
Control Engineering Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-370314 (URN)10.30420/566541293 (DOI)2-s2.0-105013845573 (Scopus ID)
Conference
2025 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025, Nuremberg, Germany, May 6 2025 - May 8 2025
Note

Part of ISBN 9783800765416

QC 20250924

Available from: 2025-09-24 Created: 2025-09-24 Last updated: 2025-09-24Bibliographically approved
Asoodar, M., Nahalparvari, M., Schneider, S., Shafikhani, I., Ingeström, G. & Nee, H.-P. (2024). A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions. IEEE Open Journal of Instrumentation and Measurement, 3, Article ID 3500113.
Open this publication in new window or tab >>A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions
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2024 (English)In: IEEE Open Journal of Instrumentation and Measurement, ISSN 2768-7236, Vol. 3, article id 3500113Article in journal (Refereed) Published
Abstract [en]

This article presents a novel method for accurate online extraction of semiconductor ON-state resistance in the presence of measurement noise. In this method, the ON-state resistance value is extracted from the measured ON-state voltage of the semiconductors and the measured load current. The extracted ON-state resistance can be used for online condition monitoring of semiconductors. The proposed method is based on the extraction of selective harmonic content. The estimated values are further enhanced through an integral action that increases the signal-to-noise ratio, making the proposed method suitable in the presence of noisy measurements. The efficacy of the proposed method is verified through simulations in the MATLAB/Simulink environment, and experimentally. The estimated ON-state resistance values from the online setup are compared to offline measurements from an industrial curve tracer, where an overall estimation error of less than 1% is observed. The proposed solution maintains its estimation accuracy under variable load conditions and for different temperatures of the device under test.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2024
Keywords
Semiconductor device measurement, Voltage measurement, Electrical resistance measurement, Temperature measurement, Resistance, Current measurement, Estimation, Condition monitoring, health monitoring, online estimation, ON-state resistance, reliability, semiconductor devices, state of health
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-350046 (URN)10.1109/OJIM.2024.3379414 (DOI)001252441500001 ()2-s2.0-85205405560 (Scopus ID)
Note

QC 20240705

Available from: 2024-07-05 Created: 2024-07-05 Last updated: 2025-01-22Bibliographically approved
Asoodar, M., Nahalparvari, M. & Nee, H.-P. (2024). A Sensorless Active Snubber Circuit for Series Connection of Semiconductor Devices in Modular Multilevel Converters. In: 2024 IEEE 9th Southern Power Electronics Conference (SPEC): . Paper presented at 2024 IEEE 9th Southern Power Electronics Conference (SPEC), Brisbane, QLD, Australia, December 2-5, 2024. Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>A Sensorless Active Snubber Circuit for Series Connection of Semiconductor Devices in Modular Multilevel Converters
2024 (English)In: 2024 IEEE 9th Southern Power Electronics Conference (SPEC), Institute of Electrical and Electronics Engineers (IEEE) , 2024Conference paper, Published paper (Refereed)
Abstract [en]

Commercially available semiconductor devices have a limited range of operating voltages. This operating voltage can be increased through series connection of the devices. In this paper, a novel active snubber circuit (ASC) is proposed that protects series-connected semiconductor devices from overvoltages during operation. The unique advantage of the proposed solution is that it does not use additional sensors or an external controller for voltage protection. That is, each ASC is equipped with sufficient components to protect its respective device. The proposed solution is mainly developed for cascaded H-bridge (CHB) and modular multilevel converters (MMCs) intended for flexible alternating current transmission systems (FACTS) and high-voltage direct current (HVDC) applications, which typically operate at low switching frequencies. Suitable extensions of the proposed design are provided for increased current capability and for possible fault-ride-through functionality. The efficacy of the proposed solution is verified by simulations in the MATLAB/Simulink environment.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2024
Keywords
Active snubber, flexible ac transmission systems, high voltage direct current, modular multilevel converter, series connection
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-358840 (URN)10.1109/SPEC62217.2024.10893142 (DOI)001445813800055 ()2-s2.0-105001121161 (Scopus ID)
Conference
2024 IEEE 9th Southern Power Electronics Conference (SPEC), Brisbane, QLD, Australia, December 2-5, 2024
Note

Part of ISBN

979-8-3503-5115-6

QC 20250415

Available from: 2025-01-21 Created: 2025-01-21 Last updated: 2025-05-27Bibliographically approved
Asoodar, M., Nahalparvari, M., Nee, H.-P. & Shafikhani, I. (2024). A Time-Skew Resilient Online Condition Monitoring Technique for Power MOSFETs Based on ON-State Resistance Estimation. In: : . Paper presented at 2024 IEEE 9th Southern Power Electronics Conference (SPEC), Brisbane, QLD, Australia, Dec. 2-5, 2024.
Open this publication in new window or tab >>A Time-Skew Resilient Online Condition Monitoring Technique for Power MOSFETs Based on ON-State Resistance Estimation
2024 (English)Conference paper, Oral presentation with published abstract (Refereed)
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-358838 (URN)
Conference
2024 IEEE 9th Southern Power Electronics Conference (SPEC), Brisbane, QLD, Australia, Dec. 2-5, 2024
Note

QC 20250218

Available from: 2025-01-21 Created: 2025-01-21 Last updated: 2025-02-18Bibliographically approved
Organisations
Identifiers
ORCID iD: ORCID iD iconorcid.org/0000-0002-1755-1365

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