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Fan, X., Smith, A. D., Forsberg, F., Wagner, S., Schröder, S., Akbari, S. S., . . . Niklaus, F. (2020). Manufacture and characterization of graphene membranes with suspended silicon proof masses for MEMS and NEMS applications. MICROSYSTEMS & NANOENGINEERING, 6(1), Article ID 17.
Open this publication in new window or tab >>Manufacture and characterization of graphene membranes with suspended silicon proof masses for MEMS and NEMS applications
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2020 (English)In: MICROSYSTEMS & NANOENGINEERING, ISSN 2055-7434, Vol. 6, no 1, article id 17Article in journal (Refereed) Published
Abstract [en]

Graphene's unparalleled strength, chemical stability, ultimate surface-to-volume ratio and excellent electronic properties make it an ideal candidate as a material for membranes in micro- and nanoelectromechanical systems (MEMS and NEMS). However, the integration of graphene into MEMS or NEMS devices and suspended structures such as proof masses on graphene membranes raises several technological challenges, including collapse and rupture of the graphene. We have developed a robust route for realizing membranes made of double-layer CVD graphene and suspending large silicon proof masses on membranes with high yields. We have demonstrated the manufacture of square graphene membranes with side lengths from 7 mu m to 110 mu m, and suspended proof masses consisting of solid silicon cubes that are from 5 mu mx5 mu mx16.4 mu m to 100 mu mx100 mu mx16.4 mu m in size. Our approach is compatible with wafer-scale MEMS and semiconductor manufacturing technologies, and the manufacturing yields of the graphene membranes with suspended proof masses were >90%, with >70% of the graphene membranes having >90% graphene area without visible defects. The measured resonance frequencies of the realized structures ranged from tens to hundreds of kHz, with quality factors ranging from 63 to 148. The graphene membranes with suspended proof masses were extremely robust, and were able to withstand indentation forces from an atomic force microscope (AFM) tip of up to 7000nN. The proposed approach for the reliable and large-scale manufacture of graphene membranes with suspended proof masses will enable the development and study of innovative NEMS devices with new functionalities and improved performances.

Place, publisher, year, edition, pages
NATURE PUBLISHING GROUP, 2020
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-273501 (URN)10.1038/s41378-019-0128-4 (DOI)000528968400001 ()34567632 (PubMedID)2-s2.0-85083758503 (Scopus ID)
Note

QC 20200520

Available from: 2020-05-20 Created: 2020-05-20 Last updated: 2022-06-26Bibliographically approved
Ottonello Briano, F., Sohlström, H., Forsberg, F., Renoux, P., Ingvarsson, S., Stemme, G. & Gylfason, K. B. (2016). A sub-μs thermal time constant electrically driven Pt nanoheater: thermo-dynamic design and frequency characterization. Applied Physics Letters, 108(19), Article ID 193106.
Open this publication in new window or tab >>A sub-μs thermal time constant electrically driven Pt nanoheater: thermo-dynamic design and frequency characterization
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2016 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 108, no 19, article id 193106Article in journal (Refereed) Published
Abstract [en]

Metal nanowires can emit coherent polarized thermal radiation, work as uncooled bolometers, and provide localized heating. In this paper, we engineer the temperature dynamics of electrically driven Pt nanoheaters on a silicon-on-insulator substrate. We present three designs and we electrically characterize and model their thermal impedance in the frequency range from 3 Hz to 3 MHz. Finally, we show a temperature modulation of 300 K while consuming less than 5 mW of power, up to a frequency of 1.3 MHz. This result can lead to significant advancements in thermography and absorption spectroscopy.

Place, publisher, year, edition, pages
American Institute of Physics (AIP), 2016
Keywords
nanowire, thermal source, 3 omega method, high frequency
National Category
Nano Technology
Research subject
Electrical Engineering; Materials Science and Engineering; Physics
Identifiers
urn:nbn:se:kth:diva-186289 (URN)10.1063/1.4948979 (DOI)000377023500046 ()2-s2.0-84969524604 (Scopus ID)
Funder
VINNOVA, 2012-01233VINNOVA, 2014-05246Stockholm County Council, 20140751Stockholm County Council, 20150910EU, FP7, Seventh Framework Programme, 267528
Note

QC 20160523

Available from: 2016-05-09 Created: 2016-05-09 Last updated: 2022-06-22Bibliographically approved
Smith, A. D., Niklaus, F., Paussa, A., Schröder, S., Fischer, A. C., Sterner, M., . . . Lemme, M. C. (2016). Piezoresistive Properties of Suspended Graphene Membranes under Uniaxial and Biaxial Strain in Nanoelectromechanical Pressure Sensors. ACS Nano, 10(11), 9879-9886
Open this publication in new window or tab >>Piezoresistive Properties of Suspended Graphene Membranes under Uniaxial and Biaxial Strain in Nanoelectromechanical Pressure Sensors
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2016 (English)In: ACS Nano, ISSN 1936-0851, E-ISSN 1936-086X, Vol. 10, no 11, p. 9879-9886Article in journal (Refereed) Published
Abstract [en]

Graphene membranes act as highly sensitive transducers in nanoelectromechanical devices due to their ultimate thinness. Previously, the piezoresistive effect has been experimentally verified in graphene using uniaxial strain in graphene. Here, we report experimental and theoretical data on the uni- and biaxial piezoresistive properties of suspended graphene membranes applied to piezoresistive pressure sensors. A detailed model that utilizes a linearized Boltzman transport equation describes accurately the charge-carrier density and mobility in strained graphene and, hence, the gauge factor. The gauge factor is found to be practically independent of the doping concentration and crystallographic orientation of the graphene films. These investigations provide deeper insight into the piezoresistive behavior of graphene membranes.

Place, publisher, year, edition, pages
American Chemical Society (ACS), 2016
Keywords
graphene, nanoelectromechanical system, NEMS, MEMS, strain gauge, transducer, piezoresistive transduction, gauge factor, pressure transducer, (suspended) graphene membranes, uniaxial and biaxial strain
National Category
Other Engineering and Technologies
Identifiers
urn:nbn:se:kth:diva-198888 (URN)10.1021/acsnano.6b02533 (DOI)000388913100016 ()27797484 (PubMedID)2-s2.0-84997235109 (Scopus ID)
Funder
EU, European Research Council, 307311 277879Swedish Research Council, E0616001 D0575901 2015-05112
Note

QC 20170109

Available from: 2017-01-09 Created: 2016-12-22 Last updated: 2024-03-15Bibliographically approved
Forsberg, F., Lapadatu, A., Kittilsland, G., Martinsen, S., Roxhed, N., Fischer, A. C., . . . Niklaus, F. (2015). CMOS-Integrated Si/SiGe Quantum-Well Infrared Microbolometer Focal Plane Arrays Manufactured With Very Large-Scale Heterogeneous 3-D Integration. IEEE Journal of Selected Topics in Quantum Electronics, 21(4), 1-11
Open this publication in new window or tab >>CMOS-Integrated Si/SiGe Quantum-Well Infrared Microbolometer Focal Plane Arrays Manufactured With Very Large-Scale Heterogeneous 3-D Integration
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2015 (English)In: IEEE Journal of Selected Topics in Quantum Electronics, ISSN 1077-260X, E-ISSN 1558-4542, Vol. 21, no 4, p. 1-11Article in journal (Refereed) Published
Abstract [en]

We demonstrate infrared focal plane arrays utilizing monocrystalline silicon/silicon-germanium (Si/SiGe) quantum-well microbolometers that are heterogeneously integrated on top of CMOS-based electronic read-out integrated circuit substrates. The microbolometers are designed to detect light in the long wavelength infrared (LWIR) range from 8 to 14 mu m and are arranged in focal plane arrays consisting of 384 x 288 microbolometer pixels with a pixel pitch of 25 mu m x 25 mu m. Focal plane arrays with two different microbolometer designs have been implemented. The first is a conventional single-layer microbolometer design and the second is an umbrella design in which the microbolometer legs are placed underneath the microbolometer membrane to achieve an improved pixel fill-factor. The infrared focal plane arrays are vacuum packaged using a CMOS compatible wafer bonding and sealing process. The demonstrated heterogeneous 3-D integration and packaging processes are implemented atwafer-level and enable independent optimization of the CMOS-based integrated circuits and the microbolometer materials. All manufacturing is done using standard semiconductor and MEMS processes, thus offering a generic approach for integrating CMOS-electronics with complex miniaturized transducer elements.

Keywords
Long-wavelength infrared imaging, LWIR, thermal imaging, uncooled microbolometer, Si/SiGe quantum-wells, wafer-level vacuum packaging, very large-scale heterogeneous 3-D integration, MEMS
National Category
Other Physics Topics
Identifiers
urn:nbn:se:kth:diva-155458 (URN)10.1109/JSTQE.2014.2358198 (DOI)000343040800001 ()2-s2.0-84907855956 (Scopus ID)
Funder
EU, FP7, Seventh Framework Programme
Note

QC 20141113

Available from: 2014-11-13 Created: 2014-11-06 Last updated: 2024-03-18Bibliographically approved
Fischer, A. C., Forsberg, F., Lapisa, M., Bleiker, S. J., Stemme, G., Roxhed, N. & Niklaus, F. (2015). Integrating MEMS and ICs [Review]. Microsystems & Nanoengineering, 1(1), 1-16, Article ID 15005.
Open this publication in new window or tab >>Integrating MEMS and ICs
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2015 (English)In: Microsystems & Nanoengineering, ISSN 2055-7434, Vol. 1, no 1, p. 1-16, article id 15005Article, book review (Refereed) Published
Abstract [en]

The majority of microelectromechanical system (MEMS) devices must be combined with integrated circuits (ICs) for operation in larger electronic systems. While MEMS transducers sense or control physical, optical or chemical quantities, ICs typically provide functionalities related to the signals of these transducers, such as analog-to-digital conversion, amplification, filtering and information processing as well as communication between the MEMS transducer and the outside world. Thus, the vast majority of commercial MEMS products, such as accelerometers, gyroscopes and micro-mirror arrays, are integrated and packaged together with ICs. There are a variety of possible methods of integrating and packaging MEMS and IC components, and the technology of choice strongly depends on the device, the field of application and the commercial requirements. In this review paper, traditional as well as innovative and emerging approaches to MEMS and IC integration are reviewed. These include approaches based on the hybrid integration of multiple chips (multi-chip solutions) as well as system-on-chip solutions based on wafer-level monolithic integration and heterogeneous integration techniques. These are important technological building blocks for the ‘More-Than-Moore’ paradigm described in the International Technology Roadmap for Semiconductors. In this paper, the various approaches are categorized in a coherent manner, their merits are discussed, and suitable application areas and implementations are critically investigated. The implications of the different MEMS and IC integration approaches for packaging, testing and final system costs are reviewed.

Keywords
Cofabrication platforms, integrated circuits (ICs), microelectromechanical system (MEMS), More-Than-Moore, multichip modules (MCMs), system-in-package (SiP), system-on-chip (SoC), three-dimensional (3D) heterogeneous integration
National Category
Natural Sciences Engineering and Technology
Identifiers
urn:nbn:se:kth:diva-169103 (URN)10.1038/micronano.2015.5 (DOI)000218367600021 ()2-s2.0-85045082677 (Scopus ID)
Note

QC 20150618

Available from: 2015-06-11 Created: 2015-06-11 Last updated: 2024-03-18Bibliographically approved
Forsberg, F., Roxhed, N., Colinge, C., Stemme, G. & Niklaus, F. (2015). Integration of distributed Ge islands onto Si wafers by adhesive wafer bonding and low-temperature Ge exfoliation. In: 2015 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2015): . Paper presented at 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS), JAN 18-22, 2015, Estoril, PORTUGAL (pp. 280-283). IEEE
Open this publication in new window or tab >>Integration of distributed Ge islands onto Si wafers by adhesive wafer bonding and low-temperature Ge exfoliation
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2015 (English)In: 2015 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2015), IEEE , 2015, p. 280-283Conference paper, Published paper (Refereed)
Abstract [en]

We present a novel and highly efficient wafer-level batch transfer process for populating silicon (Si) wafers with distributed islands of thin single-crystalline germanium (Ge) layers. This is achieved by transferring Ge from a Si wafer containing thick Ge dies to a Si target wafer by adhesive wafer-bonding and subsequent low-temperature Ge exfoliation.

Place, publisher, year, edition, pages
IEEE, 2015
Series
Proceedings IEEE Micro Electro Mechanical Systems, ISSN 1084-6999
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-184061 (URN)10.1109/MEMSYS.2015.7050943 (DOI)000370382900075 ()2-s2.0-84931042657 (Scopus ID)978-1-4799-7955-4 (ISBN)
Conference
28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS), JAN 18-22, 2015, Estoril, PORTUGAL
Note

QC 20160323

Available from: 2016-03-23 Created: 2016-03-22 Last updated: 2024-03-18
Smith, A. D., Elgammal, K., Niklaus, F., Delin, A., Fischer, A. C., Vaziri, S., . . . Lemme, M. C. (2015). Resistive graphene humidity sensors with rapid and direct electrical readout. Nanoscale, 7(45), 19099-19109
Open this publication in new window or tab >>Resistive graphene humidity sensors with rapid and direct electrical readout
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2015 (English)In: Nanoscale, ISSN 2040-3364, E-ISSN 2040-3372, Vol. 7, no 45, p. 19099-19109Article in journal (Refereed) Published
Abstract [en]

We demonstrate humidity sensing using a change of the electrical resistance of single-layer chemical vapor deposited (CVD) graphene that is placed on top of a SiO2 layer on a Si wafer. To investigate the selectivity of the sensor towards the most common constituents in air, its signal response was characterized individually for water vapor (H2O), nitrogen (N-2), oxygen (O-2), and argon (Ar). In order to assess the humidity sensing effect for a range from 1% relative humidity (RH) to 96% RH, the devices were characterized both in a vacuum chamber and in a humidity chamber at atmospheric pressure. The measured response and recovery times of the graphene humidity sensors are on the order of several hundred milliseconds. Density functional theory simulations are employed to further investigate the sensitivity of the graphene devices towards water vapor. The interaction between the electrostatic dipole moment of the water and the impurity bands in the SiO(2)d substrate leads to electrostatic doping of the graphene layer. The proposed graphene sensor provides rapid response direct electrical readout and is compatible with back end of the line (BEOL) integration on top of CMOS-based integrated circuits.

Place, publisher, year, edition, pages
Royal Society of Chemistry, 2015
National Category
Condensed Matter Physics
Identifiers
urn:nbn:se:kth:diva-179618 (URN)10.1039/c5nr06038a (DOI)000364852500035 ()26523705 (PubMedID)2-s2.0-84947265250 (Scopus ID)
Funder
Swedish Research Council, E0616001 D0575901Knut and Alice Wallenberg FoundationSwedish Energy Agency
Note

QC 20160111

Available from: 2016-01-11 Created: 2015-12-17 Last updated: 2024-03-18Bibliographically approved
Smith, A. D., Niklaus, F., Vaziri, S., Fischer, A. C., Sterner, M., Forsberg, F., . . . Lemme, M. C. (2014). Biaxial strain in suspended graphene membranes for piezoresistive sensing. In: 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS): . Paper presented at 27th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2014; San Francisco, CA; United States; 26 January 2014 through 30 January 2014 (pp. 1055-1058). IEEE
Open this publication in new window or tab >>Biaxial strain in suspended graphene membranes for piezoresistive sensing
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2014 (English)In: 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS), IEEE , 2014, p. 1055-1058Conference paper, Published paper (Refereed)
Abstract [en]

Pressure sensors based on suspended graphene membranes have shown extraordinary sensitivity for uniaxial strains, which originates from graphene's unique electrical and mechanical properties and thinness [1]. This work compares through both theory and experiment the effect of cavity shape and size on the sensitivity of piezoresistive pressure sensors based on suspended graphene membranes. Further, the paper analyzes the effect of both biaxial and uniaxial strain on the membranes. Previous studies examined uniaxial strain through the fabrication of long, rectangular cavities. The present work uses circular cavities of varying sizes in order to obtain data from biaxially strained graphene membranes.

Place, publisher, year, edition, pages
IEEE, 2014
Series
Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS), ISSN 1084-6999
Keywords
Membranes, MEMS, Pressure sensors, Strain, Biaxial strains, Electrical and mechanical properties, Piezoresistive pressure sensors, Piezoresistive sensing, Rectangular cavity, Strained graphene, Suspended graphene, Uni-axial strains, Graphene
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-145475 (URN)10.1109/MEMSYS.2014.6765826 (DOI)000352217500269 ()2-s2.0-84898971449 (Scopus ID)978-1-4799-3509-3 (ISBN)
Conference
27th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2014; San Francisco, CA; United States; 26 January 2014 through 30 January 2014
Note

QC 20140521

Available from: 2014-05-21 Created: 2014-05-21 Last updated: 2024-03-18
Saharil, F., Forsberg, F., Niklaus, F., Haraldsson, T., Wijngaart, W. v. & Gylfason, K. B. (2014). Dry adhesive bonding of porous membranes to microstructured silicon wafers using the OSTE(+) dual-cure polymer. In: Proceedings of the 10th Micronano System Workshop (MSW 2014): . Paper presented at Micronano System Workshop (MSW 2014), Uppsala, May 15-16, 2014..
Open this publication in new window or tab >>Dry adhesive bonding of porous membranes to microstructured silicon wafers using the OSTE(+) dual-cure polymer
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2014 (English)In: Proceedings of the 10th Micronano System Workshop (MSW 2014), 2014Conference paper, Poster (with or without abstract) (Other academic)
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-145124 (URN)
Conference
Micronano System Workshop (MSW 2014), Uppsala, May 15-16, 2014.
Projects
PositiveM&M
Funder
EU, FP7, Seventh Framework Programme, 257401EU, European Research Council, 277879
Note

NQC 2015

Available from: 2014-05-09 Created: 2014-05-09 Last updated: 2024-03-15Bibliographically approved
Smith, A. D., Niklaus, F., Vaziri, S., Fischer, A. C., Forsberg, F., Schroder, S., . . . Lemme, M. C. (2014). Graphene-based piezoresistive pressure sensing for uniaxial and biaxial strains. In: 2014 Silicon Nanoelectronics Workshop, SNW 2014: . Paper presented at Silicon Nanoelectronics Workshop, SNW 2014, 8 June 2014 through 9 June 2014. Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>Graphene-based piezoresistive pressure sensing for uniaxial and biaxial strains
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2014 (English)In: 2014 Silicon Nanoelectronics Workshop, SNW 2014, Institute of Electrical and Electronics Engineers (IEEE), 2014Conference paper, Published paper (Refereed)
Abstract [en]

The piezoresistive effect in graphene has been experimentally demonstrated for both uniaxial and biaxial strains. For uniaxial strain, rectangular membranes were measured while circular membranes provided biaxial strain. Gauge factors have also been extracted and compared to previous literature as well as simulations.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2014
Keywords
Nanoelectronics, Strain, Biaxial strains, Circular membranes, Gauge factors, Piezo-resistive, Piezoresistive effects, Pressure sensing, Uni-axial strains, Graphene
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-186805 (URN)10.1109/SNW.2014.7348615 (DOI)000393376800091 ()2-s2.0-84963853586 (Scopus ID)9781479956777 (ISBN)
Conference
Silicon Nanoelectronics Workshop, SNW 2014, 8 June 2014 through 9 June 2014
Note

QC 20160615

Available from: 2016-06-15 Created: 2016-05-13 Last updated: 2024-03-15Bibliographically approved
Organisations
Identifiers
ORCID iD: ORCID iD iconorcid.org/0000-0002-9820-8728

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