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2014 (English) In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 104, no 9, p. 092405-Article in journal (Refereed) Published
Abstract [en] The nano-scale spin torque oscillator (STO) is a compelling device for on-chip, highly tunable microwave frequency signal generation. Currently, one of the most important challenges for the STO is to increase its longer-time frequency stability by decreasing the 1/f frequency noise, but its high level makes even its measurement impossible using the phase noise mode of spectrum analyzers. Here, we present a custom made time-domain measurement system with 150MHz measurement bandwidth making possible the investigation of the variation of the 1/f as well as the white frequency noise in a STO over a large set of operating points covering 18-25GHz. The 1/f level is found to be highly dependent on the oscillation amplitude-frequency non-linearity and the vicinity of unexcited oscillation modes. These findings elucidate the need for a quantitative theoretical treatment of the low-frequency, colored frequency noise in STOs. Based on the results, we suggest that the 1/f frequency noise possibly can be decreased by improving the microstructural quality of the metallic thin films.
Keywords Amplitude-frequency, Measurement bandwidth, Metallic thin films, Spin-torque oscillator (STO), Spin-torque oscillators, Theoretical treatments, Time domain measurement, Tunable microwave
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Identifiers urn:nbn:se:kth:diva-144370 (URN) 10.1063/1.4867257 (DOI) 000332729200057 () 2-s2.0-84896799716 (Scopus ID)
Funder Swedish Foundation for Strategic Research Swedish Research Council, 2009-4190Knut and Alice Wallenberg Foundation
Note QC 20140422
2014-04-222014-04-222024-03-15 Bibliographically approved