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Wang, H. (2024). Amplitude-modulated EM side-channel attack on provably secure masked AES. Journal of Cryptographic Engineering, 14(3), 537-549
Open this publication in new window or tab >>Amplitude-modulated EM side-channel attack on provably secure masked AES
2024 (English)In: Journal of Cryptographic Engineering, ISSN 2190-8508, Vol. 14, no 3, p. 537-549Article in journal (Refereed) Published
Abstract [en]

Recently a new type of side channels was discovered, called amplitude-modulated electromagnetic (EM) emanations from mixed-signal circuits. Unlike power analysis or near field EM analysis, attacks based on amplitude-modulated EM emanations do not require the close physical access to the victim device, which makes the attack particularly threatening. However, all existing amplitude-modulated EM attacks on AES focus on implementations of unprotected TinyAES, which is less likely to be used when the implementation is not overly resource constrained. This paper presents the first deep learning based side-channel attack on AES-128 with a Rivain–Prouff masking scheme by using amplitude-modulated EM emanations as the side channel. Rivian–Prouff masking scheme is a provably secure higher-order masking scheme for AES. To bypass the theoretical strength of the addition-chain based Boolean masked SBox, we train neural networks on trace segments corresponding to the MixColumns operation in which the data loading instructions for SBox output leak information. By comparing two different training strategies, we show that it is feasible to recover the key from an ARM Cortex-M4 CPU implementation of AES-128 with a Rivain–Prouff masking scheme by using the amplitude-modulated EM emanations leaked from the victim device, which has a Bluetooth module embedded on the board.

Place, publisher, year, edition, pages
Springer Science and Business Media Deutschland GmbH, 2024
Keywords
AES, Amplitude-modulated EM emanations, Deep learning, Rivian–Prouff masking scheme, Side-channel attack
National Category
Embedded Systems
Identifiers
urn:nbn:se:kth:diva-366641 (URN)10.1007/s13389-024-00347-3 (DOI)001183458100001 ()2-s2.0-85187648031 (Scopus ID)
Note

QC 20250709

Available from: 2025-07-09 Created: 2025-07-09 Last updated: 2025-07-09Bibliographically approved
Zhao, A., Wang, H., Boßer, C. & Leksell, M. (2024). FEM and CFD thermal modeling of an axial-flux induction machine with experimental validation. Case Studies in Thermal Engineering, 53, Article ID 103879.
Open this publication in new window or tab >>FEM and CFD thermal modeling of an axial-flux induction machine with experimental validation
2024 (English)In: Case Studies in Thermal Engineering, E-ISSN 2214-157X, Vol. 53, article id 103879Article in journal (Refereed) Published
Abstract [en]

Axial-flux electrical machines are ideal candidates as in-wheel motors for electrical vehicles (EVs). Due to their characteristics of high power density and compact structure, thermal management is vital for them. Lowering the temperature of the stator windings can protect the insulation material from rapid degradation and reduce the extra copper losses by decreasing their electrical resistance. Contrary to the widely reported axial-flux permanent magnet synchronous machines, thermal modeling methods of axial-flux induction machines are rarely seen in previous literature. Hence, the present work aims at investigating their thermal response based on both the finite element method (FEM) and computational fluid dynamics (CFD) techniques. In addition, a test rig is built to validate the computed results of these two thermal models with the experimental measurement. The CFD conjugate heat transfer analysis is found to be more accurate than the FEM thermal analysis in predicting the temperature distribution of different components in the machine and the temperature rise of the airflow, with lower than 5 ∘C average errors deviating from the corresponding measured data at three rotation speeds. Additionally, the CFD simulation is able to capture the backflow occurring near the outlets of the casing that has been found during the experiments.

Place, publisher, year, edition, pages
Elsevier BV, 2024
Keywords
Axial-flux induction machine, CFD, Conjugate heat transfer, FEM, Temperature measurement, Thermal modeling
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-341943 (URN)10.1016/j.csite.2023.103879 (DOI)001139639800001 ()2-s2.0-85180365752 (Scopus ID)
Note

Correction in DOI 10.1016/j.csite.2024.104530

QC 20240108

Available from: 2024-01-08 Created: 2024-01-08 Last updated: 2024-12-06Bibliographically approved
Hu, F., Wang, H. & Wang, J. (2022). Cross subkey side channel analysis based on small samples. Scientific Reports, 12(1), Article ID 6254.
Open this publication in new window or tab >>Cross subkey side channel analysis based on small samples
2022 (English)In: Scientific Reports, E-ISSN 2045-2322, Vol. 12, no 1, article id 6254Article in journal (Refereed) Published
Abstract [en]

The majority of recently demonstrated Deep-Learning Side-Channel Analysis (DLSCA) use neural networks trained on a segment of traces containing operations only related to the target subkey. However, when the size of the training set is limited, as in this paper with only 5K power traces, the deep learning (DL) model cannot effectively learn the internal features of the data due to insufficient training data. In this paper, we propose a cross-subkey training approach that acts as a trace augmentation. We train deep-learning models not only on a segment of traces containing the SBox operation of the target subkey of AES-128 but also on segments for other 15 subkeys. Experimental results show that the accuracy of the subkey combination training model is 28.20% higher than that of the individual subkey training model on traces captured in the microcontroller implementation of the STM32F3 with AES-128. And validation is performed on two additional publicly available datasets. At the same time, the number of traces that need to be captured when the model is trained is greatly reduced, demonstrating the effectiveness and practicality of the method.

Place, publisher, year, edition, pages
Springer Nature, 2022
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-311550 (URN)10.1038/s41598-022-10279-9 (DOI)000782844000021 ()35428761 (PubMedID)2-s2.0-85128271346 (Scopus ID)
Note

QC 20220429

Available from: 2022-04-29 Created: 2022-04-29 Last updated: 2022-09-15Bibliographically approved
Hu, F., Wang, H. & Wang, J. (2022). Multi-Leak Deep-Learning Side-Channel Analysis. IEEE Access, 10, 22610-22621
Open this publication in new window or tab >>Multi-Leak Deep-Learning Side-Channel Analysis
2022 (English)In: IEEE Access, E-ISSN 2169-3536, Vol. 10, p. 22610-22621Article in journal (Refereed) Published
Abstract [en]

Deep Learning Side-Channel Attacks (DLSCAs) have become a realistic threat to implementations of cryptographic algorithms, such as Advanced Encryption Standard (AES). By utilizing deep-learning models to analyze side-channel measurements, the attacker is able to derive the secret key of the cryptographic algorithm. However, when traces have multiple leakage intervals for a specific attack point, the majority of existing works train neural networks on these traces directly, without a appropriate preprocess step for each leakage interval. This degenerates the quality of profiling traces due to the noise and non-primary components. In this paper, we first divide the multi-leaky traces into leakage intervals and train models on different intervals separately. Afterwards, we concatenate these neural networks to build the final network, which is called multi-input model. We test the proposed multi-input model on traces captured from STM32F3 microcontroller implementations of AES-128 and show a 2-fold improvement over the previous single-input attacks.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2022
Keywords
Mathematical models, Software, Side-channel attacks, Deep learning, Power demand, Neural networks, Feature extraction, AES, multiple leakage, multi-input model
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-310194 (URN)10.1109/ACCESS.2022.3152831 (DOI)000764634000001 ()2-s2.0-85125338124 (Scopus ID)
Note

QC 20220404

Available from: 2022-04-04 Created: 2022-04-04 Last updated: 2022-06-25Bibliographically approved
Wang, R., Wang, H., Dubrova, E. & Brisfors, M. (2021). Advanced Far Field em Side-Channel Attack on AES. In: CPSS 2021 - Proceedings of the 7th ACM Cyber-Physical System Security Workshop: . Paper presented at 7th ACM Cyber-Physical System Security Workshop, CPSS 2021, co-located with ACM AsiaCCS 2021, 7 June 2021 (pp. 29-39). Association for Computing Machinery, Inc
Open this publication in new window or tab >>Advanced Far Field em Side-Channel Attack on AES
2021 (English)In: CPSS 2021 - Proceedings of the 7th ACM Cyber-Physical System Security Workshop, Association for Computing Machinery, Inc , 2021, p. 29-39Conference paper, Published paper (Refereed)
Abstract [en]

Several attacks on AES using far field electromagnetic (EM) emission as a side channel have been recently presented. Unlike power analysis or near filed EM analysis, far field EM attacks do not require a close physical proximity to the device under attack. However, in all previous attacks traces for the profiling stage are also captured at a distance (fixed or variable) from the profiling devices. This degenerates the quality of profiling traces due to noise and interference. In this paper, we train deep learning models on "clean"traces, captured through a coaxial cable. Our experiments show that the resulting models can extract the AES key from less than 500 traces on average captured at 15 m from the victim device without repeating each encryption more than once. This is a 20-fold improvement over the previous attacks which require about 10K traces for the same conditions. 

Place, publisher, year, edition, pages
Association for Computing Machinery, Inc, 2021
Keywords
AES, deep learning, far field EM emissions, profiled attack, side-channel analysis, Embedded systems, Far field, Learning models, Near-filed, Physical proximity, Power analysis, Side-channel, Side channel attack
National Category
Computer Sciences Communication Systems
Identifiers
urn:nbn:se:kth:diva-310155 (URN)10.1145/3457339.3457982 (DOI)001468552300005 ()2-s2.0-85108554189 (Scopus ID)
Conference
7th ACM Cyber-Physical System Security Workshop, CPSS 2021, co-located with ACM AsiaCCS 2021, 7 June 2021
Note

Part of proceedings: ISBN 978-1-4503-8402-5

QC 20220330

Available from: 2022-03-30 Created: 2022-03-30 Last updated: 2025-12-05Bibliographically approved
Hu, F., Wang, H. & Wang, J. (2021). Deep-Learning Side-Channel Attack Against STM32 Implementation of AES. In: 2021 International Conference On Computational Science And Computational Intelligence (CSCI 2021): . Paper presented at International Conference on Computational Science and Computational Intelligence (CSCI), DEC 15-17, 2021, Las Vegas, NV (pp. 844-847). Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>Deep-Learning Side-Channel Attack Against STM32 Implementation of AES
2021 (English)In: 2021 International Conference On Computational Science And Computational Intelligence (CSCI 2021), Institute of Electrical and Electronics Engineers (IEEE) , 2021, p. 844-847Conference paper, Published paper (Refereed)
Abstract [en]

Deep-Learning Side-Channel Attacks (DLSCAs) have become a realistic threat to cryptographic algorithms, such as Advanced Encryption Standard (AES). Since the encryption has to run in hardware at some point to actually do things, there might be some unintentional physical leakage, such as the different amount of power consumed by the victim device. By using deep-learning models to analyze the power traces, the attacker is able to derive the secret key. In this project, we implement a real deep-learning based attack to against a STM32 implementation of AES. We apply four different types of neural networks, MLP, CNN, LSTM and RNN, to classify traces. Afterwards, we evaluate to which extent different types of models could make the attack more efficient.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2021
Keywords
Side-channel attack, MLP, CNN, LSTM, RNN
National Category
Computer Engineering Computer Sciences Information Systems
Identifiers
urn:nbn:se:kth:diva-316735 (URN)10.1109/CSCI54926.2021.00030 (DOI)000832229300148 ()2-s2.0-85133913927 (Scopus ID)
Conference
International Conference on Computational Science and Computational Intelligence (CSCI), DEC 15-17, 2021, Las Vegas, NV
Note

Part of proceedings: ISBN 978-1-6654-5841-2, QC 20220830

Available from: 2022-08-30 Created: 2022-08-30 Last updated: 2022-09-07Bibliographically approved
Wang, H. & Dubrova, E. (2021). Federated Learning in Side-Channel Analysis. In: Information Security and Cryptology – ICISC 2020: 23rd International Conference on Information Security and Cryptology, ICISC 202. Paper presented at Information Security and Cryptology - ICISC 2020 - 23rd International Conference, Seoul, South Korea, December 2-4, 2020, Proceedings (pp. 257-272). Springer Science and Business Media Deutschland GmbH
Open this publication in new window or tab >>Federated Learning in Side-Channel Analysis
2021 (English)In: Information Security and Cryptology – ICISC 2020: 23rd International Conference on Information Security and Cryptology, ICISC 202, Springer Science and Business Media Deutschland GmbH , 2021, p. 257-272Conference paper, Published paper (Refereed)
Abstract [en]

Recently introduced federated learning is an attractive framework for the distributed training of deep learning models with thousands of participants. However, it can potentially be used with malicious intent. For example, adversaries can use their smartphones to jointly train a classifier for extracting secret keys from the smartphones’ SIM cards without sharing their side-channel measurements with each other. With federated learning, each participant might be able to create a strong model in the absence of sufficient training data. Furthermore, they preserve their anonymity. In this paper, we investigate this new attack vector in the context of side-channel attacks. We compare the federated learning, which aggregates model updates submitted by N participants, with two other aggregating approaches: (1) training on combined side-channel data from N devices, and (2) using an ensemble of N individually trained models. Our first experiments on 8-bit Atmel ATxmega128D4 microcontroller implementation of AES show that federated learning is capable of outperforming the other approaches. 

Place, publisher, year, edition, pages
Springer Science and Business Media Deutschland GmbH, 2021
Series
Lecture Notes in Computer Science, ISSN 0302-9743, E-ISSN 1611-3349
Keywords
AES, Federated learning, Power analysis, Side-channel attack, Chromium compounds, Deep learning, Learning systems, Security of data, Smartphones, Attack vector, Learning models, Model updates, Secret key, Side-channel, Side-channel analysis, SIM cards, Training data, Side channel attack
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-307224 (URN)10.1007/978-3-030-68890-5_14 (DOI)000886642900014 ()2-s2.0-85102647706 (Scopus ID)
Conference
Information Security and Cryptology - ICISC 2020 - 23rd International Conference, Seoul, South Korea, December 2-4, 2020, Proceedings
Note

Part of proceedings: ISBN 978-3-030-68889-9

QC 20220118

Available from: 2022-01-18 Created: 2022-01-18 Last updated: 2023-02-08Bibliographically approved
Wang, H. & Dubrova, E. (2021). Tandem Deep Learning Side-Channel Attack on FPGA Implementation of AES. SN Computer Science, 2(5), Article ID 373.
Open this publication in new window or tab >>Tandem Deep Learning Side-Channel Attack on FPGA Implementation of AES
2021 (English)In: SN Computer Science, ISSN 2662-995X, Vol. 2, no 5, article id 373Article in journal (Refereed) Published
Abstract [en]

Side-channel attacks have become a realistic threat to implementations of cryptographic algorithms, especially with the help of deep-learning techniques. The majority of recently demonstrated deep-learning side-channel attacks use a single neural network classifier to extract the secret from implementations of cryptographic algorithms. The potential benefits of combining multiple classifiers using the ensemble learning method have not been fully explored in the side-channel attack’s context. In this paper, we propose a tandem approach for the attack in which multiple models are trained on different attack points but are used in parallel to recover the key. Such an approach allows us to considerably reduce (33.5% on average) the number of traces required to recover the key from an FPGA implementation of AES by power analysis. We also show that not all combinations of classifiers improve the attack efficiency.

Place, publisher, year, edition, pages
Springer Nature, 2021
Keywords
AES, Deep learning, FPGA, Side-channel attack, Tandem model
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-316145 (URN)10.1007/s42979-021-00755-w (DOI)2-s2.0-85131832140 (Scopus ID)
Note

QC 20220810

Available from: 2022-08-10 Created: 2022-08-10 Last updated: 2023-02-08Bibliographically approved
Wang, R., Wang, H. & Dubrova, E. (2020). Far Field EM Side-Channel Attack on AES Using Deep Learning. In: ASHES 2020 - Proceedings of the 4th ACM Workshop on Attacks and Solutions in Hardware Security: . Paper presented at 4th ACM Workshop on Attacks and Solutions in Hardware Security Workshop, ASHES@CCS 2020, Virtual Event, USA, November 13, 2020 (pp. 35-44). Association for Computing Machinery (ACM)
Open this publication in new window or tab >>Far Field EM Side-Channel Attack on AES Using Deep Learning
2020 (English)In: ASHES 2020 - Proceedings of the 4th ACM Workshop on Attacks and Solutions in Hardware Security, Association for Computing Machinery (ACM) , 2020, p. 35-44Conference paper, Published paper (Refereed)
Abstract [en]

We present the first deep learning-based side-channel attack on AES-128 using far field electromagnetic emissions as a side channel. Our neural networks are trained on traces captured from five different Bluetooth devices at five different distances to target and tested on four other Bluetooth devices. We can recover the key from less than 10K traces captured in an office environment at 15 m distance to target even if the measurement for each encryption is taken only once. Previous template attacks required multiple repetitions of the same encryption. For the case of 1K repetitions, we need less than 400 traces on average at 15 m distance to target. This improves the template attack presented at CHES'2020 which requires 5K traces and key enumeration up to 223.

Place, publisher, year, edition, pages
Association for Computing Machinery (ACM), 2020
Keywords
aes, deep learning, em analysis, far field em emissions, profiled attack, side-channel analysis, Bluetooth, Hardware security, Bluetooth device, Distance to targets, Electromagnetic emissions, Far field, Office environments, Side-channel, Template Attacks, Side channel attack
National Category
Communication Systems
Identifiers
urn:nbn:se:kth:diva-291403 (URN)10.1145/3411504.3421214 (DOI)001436887200005 ()2-s2.0-85097354491 (Scopus ID)
Conference
4th ACM Workshop on Attacks and Solutions in Hardware Security Workshop, ASHES@CCS 2020, Virtual Event, USA, November 13, 2020
Note

QC 20210331

Available from: 2021-03-31 Created: 2021-03-31 Last updated: 2025-12-05Bibliographically approved
Wang, H., Forsmark, S., Brisfors, M. & Dubrova, E. (2020). Multi-Source Training Deep-Learning Side-Channel Attacks. In: Proceedings 50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020: . Paper presented at 50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020, Miyazaki, Japan, November 9-11, 2020 (pp. 58-63). Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>Multi-Source Training Deep-Learning Side-Channel Attacks
2020 (English)In: Proceedings 50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020, Institute of Electrical and Electronics Engineers (IEEE) , 2020, p. 58-63Conference paper, Published paper (Refereed)
Abstract [en]

Recently, several deep-learning side-channel attacks on cryptographic algorithms were demonstrated. With the help of a trained deep-learning model, the attacker extracts the key from a few power traces captured from a victim device. However, previous works have shown that the inter-chip variation may significantly reduce the attack success probability. In this paper, we quantify the effect of inter-chip variation on the classification accuracy of Multi-Layer Perceptron (MLP) models. We show that, by training on multiple chips, we can increase the probability of recovering the key from a single trace from 39.95% to 86.07% on average. We also evaluate how the printed circuit board diversity affects the classification accuracy.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2020
Series
International Symposium on Multiple-Valued Logic, ISSN 0195-623X
Keywords
Side-channel attack, power analysis, deep learning, multi-source training, AES
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-298617 (URN)10.1109/ISMVL49045.2020.00-29 (DOI)000656495500011 ()2-s2.0-85097343863 (Scopus ID)
Conference
50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020, Miyazaki, Japan, November 9-11, 2020
Note

Part of proceedings: ISBN 978-1-7281-5406-0

QC 20210710

Available from: 2021-07-10 Created: 2021-07-10 Last updated: 2023-02-08Bibliographically approved
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ORCID iD: ORCID iD iconorcid.org/0000-0001-9630-5869

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