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Forsmark, Sebastian
Publications (3 of 3) Show all publications
Brisfors, M., Forsmark, S. & Dubrova, E. (2021). How Deep Learning Helps Compromising USIM. In: Liardet, PY Mentens, N (Ed.), Smart Card Research and Advanced Applications, CARDIS 2020: . Paper presented at 19th International Conference on Smart Card Research and Advanced Applications, CARDIS 2020 Virtual, Online18 November 2020 through 19 November 2020 (pp. 135-150). Springer Nature, 12609
Open this publication in new window or tab >>How Deep Learning Helps Compromising USIM
2021 (English)In: Smart Card Research and Advanced Applications, CARDIS 2020 / [ed] Liardet, PY Mentens, N, Springer Nature , 2021, Vol. 12609, p. 135-150Conference paper, Published paper (Refereed)
Abstract [en]

It is known that secret keys can be extracted from some USIM cards using Correlation Power Analysis (CPA). In this paper, we demonstrate a more advanced attack on USIMs, based on deep learning. We show that a Convolutional Neural Network (CNN) trained on one USIM can recover the key from another USIM using at most 20 traces (four traces on average). Previous CPA attacks on USIM cards required high-quality oscilloscopes for power trace acquisition, an order of magnitude more traces from the victim card, and expert-level skills from the attacker. Now the attack can be mounted with a $1000 budget and basic skills in side-channel analysis.

Place, publisher, year, edition, pages
Springer Nature, 2021
Series
Lecture Notes in Computer Science, ISSN 0302-9743 ; 12609
Keywords
USIM, MILENAGE, AES, Power analysis, Deep learning
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-306350 (URN)10.1007/978-3-030-68487-7_9 (DOI)000723846600009 ()2-s2.0-85101845297 (Scopus ID)
Conference
19th International Conference on Smart Card Research and Advanced Applications, CARDIS 2020 Virtual, Online18 November 2020 through 19 November 2020
Note

QC 20211215

Part of proceeding: ISBN 978-3-030-68487-7; 978-3-030-68486-0

Available from: 2021-12-15 Created: 2021-12-15 Last updated: 2022-06-25Bibliographically approved
Wang, H., Forsmark, S., Brisfors, M. & Dubrova, E. (2020). Multi-Source Training Deep-Learning Side-Channel Attacks. In: Proceedings 50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020: . Paper presented at 50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020, Miyazaki, Japan, November 9-11, 2020 (pp. 58-63). Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>Multi-Source Training Deep-Learning Side-Channel Attacks
2020 (English)In: Proceedings 50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020, Institute of Electrical and Electronics Engineers (IEEE) , 2020, p. 58-63Conference paper, Published paper (Refereed)
Abstract [en]

Recently, several deep-learning side-channel attacks on cryptographic algorithms were demonstrated. With the help of a trained deep-learning model, the attacker extracts the key from a few power traces captured from a victim device. However, previous works have shown that the inter-chip variation may significantly reduce the attack success probability. In this paper, we quantify the effect of inter-chip variation on the classification accuracy of Multi-Layer Perceptron (MLP) models. We show that, by training on multiple chips, we can increase the probability of recovering the key from a single trace from 39.95% to 86.07% on average. We also evaluate how the printed circuit board diversity affects the classification accuracy.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2020
Series
International Symposium on Multiple-Valued Logic, ISSN 0195-623X
Keywords
Side-channel attack, power analysis, deep learning, multi-source training, AES
National Category
Computer Sciences
Identifiers
urn:nbn:se:kth:diva-298617 (URN)10.1109/ISMVL49045.2020.00-29 (DOI)000656495500011 ()2-s2.0-85097343863 (Scopus ID)
Conference
50th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2020, Miyazaki, Japan, November 9-11, 2020
Note

Part of proceedings: ISBN 978-1-7281-5406-0

QC 20210710

Available from: 2021-07-10 Created: 2021-07-10 Last updated: 2023-02-08Bibliographically approved
Wang, H., Brisfors, M., Forsmark, S. & Dubrova, E. (2019). How diversity affects deep-learning side-channel attacks. In: 2019 IEEE Nordic Circuits and Systems Conference, NORCAS 2019: NORCHIP and International Symposium of System-on-Chip, SoC 2019 - Proceedings. Paper presented at 2019 IEEE Nordic Circuits and Systems Conference, NORCAS 2019: NORCHIP and International Symposium of System-on-Chip (SoC), Helsinki, Finland, October 29-30, 2019. Institute of Electrical and Electronics Engineers (IEEE)
Open this publication in new window or tab >>How diversity affects deep-learning side-channel attacks
2019 (English)In: 2019 IEEE Nordic Circuits and Systems Conference, NORCAS 2019: NORCHIP and International Symposium of System-on-Chip, SoC 2019 - Proceedings, Institute of Electrical and Electronics Engineers (IEEE) , 2019Conference paper, Published paper (Refereed)
Abstract [en]

Deep learning side-channel attacks are an emerging threat to the security of implementations of cryptographic algorithms. The attacker first trains a model on a large set of side-channel traces captured from a chip with a known key. The trained model is then used to recover the unknown key from a few traces captured from a victim chip. The first successful attacks have been demonstrated recently. However, they typically train and test on power traces captured from the same device. In this paper, we show that it is important to train and test on traces captured from different boards. Otherwise, it is easy to overestimate the classification accuracy. For example, if we train and test an MLP model on power traces captured from the same board, we can recover all key byte values with 88.5% accuracy from a single trace. However, the single-trace attack accuracy drops to 13.7% if we test on traces captured from a board different from the one we used for training, even if both boards carry identical chips.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2019
Keywords
AES, CNN, deep learning, MLP, power analysis, Side-channel attack, Programmable logic controllers, Classification accuracy, Cryptographic algorithms, MLP model, Power traces, Side-channel, Side channel attack
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:kth:diva-268045 (URN)10.1109/NORCHIP.2019.8906945 (DOI)000722212700033 ()2-s2.0-85075973980 (Scopus ID)
Conference
2019 IEEE Nordic Circuits and Systems Conference, NORCAS 2019: NORCHIP and International Symposium of System-on-Chip (SoC), Helsinki, Finland, October 29-30, 2019
Note

Part of proceedings ISBN 9781728127699

QC 20200327

Available from: 2020-03-27 Created: 2020-03-27 Last updated: 2023-02-08Bibliographically approved
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