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Assessment of Junction Termination Extension Structures For Ultrahigh-Voltage Silicon Carbide Pin-Diodes; A Simulation Study
KTH, School of Electrical Engineering and Computer Science (EECS), Electrical Engineering, Electric Power and Energy Systems. Hitachi ABB Power Grids. (Power Electronics)ORCID iD: 0000-0001-9790-5524
Hitachi ABB Power Grids.
KTH, School of Electrical Engineering and Computer Science (EECS), Electrical Engineering, Electric Power and Energy Systems.ORCID iD: 0000-0002-1755-1365
2021 (English)In: IEEE Open Journal of Power Electronics, ISSN 2644-1314, Vol. 2, p. 304-314Article in journal (Refereed) Published
Abstract [en]

The junction termination extension (JTE) structures for ultrahigh-voltage (UHV) devices consumes a considerable part of the semiconductor chip area. The JTE area is closely related to chip performance, process yield and ultimately device cost. The JTE lengths for UHV devices (i.e., > 30 kV) are still unknown, not visible in the scientific literature and have therefore been predicted in this study by means of two-dimensional numerical simulations using the Sentaurus based technology computer-aided design (TCAD) tool. A previously reported space-modulated, two-zone JTE (SM-JTE) structure has been used as an input to set up a suitable TCAD model, which is further scaled to JTE lengths required for 40 kV class and 50 kV class SiC PiN diodes. The simulation results indicate that the SM-JTE requires an 1800 μm one-sided JTE length with 27 guard rings for a 40 kV theoretical PiN diode and 2700 μm with 36 guard rings for a 50 kV device, resulting in breakdown voltages of 41.4 kV and 51.7 kV, respectively. Moreover, the design considerations of different JTE categories are discussed with focus on the adaptability of the termination structures in ultrahigh-voltage devices, e.g., V B > 30 kV, which results in a comparison of the SM-JTE structure with other high-voltage JTE designs.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2021. Vol. 2, p. 304-314
Keywords [en]
4H-SiC device, JTE structure, junction termination extension design, PiN Diode, ultrahighvoltage device, wide bandgap device
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-294254DOI: 10.1109/OJPEL.2021.3072486Scopus ID: 2-s2.0-85122417839OAI: oai:DiVA.org:kth-294254DiVA, id: diva2:1554323
Funder
SweGRIDS - Swedish Centre for Smart Grids and Energy Storage, CP16
Note

QC 20220921

Available from: 2021-05-12 Created: 2021-05-12 Last updated: 2022-09-21Bibliographically approved
In thesis
1. Ultrahigh-Voltage Silicon Carbide Device Performance, Requirements, and Limitations in High-Power Applications
Open this publication in new window or tab >>Ultrahigh-Voltage Silicon Carbide Device Performance, Requirements, and Limitations in High-Power Applications
2021 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

The increased awareness of the on-going climate change accelerates the electric energy system transformation from fossil-fueled power sources towards systems with larger portions of renewable energy sources. Moreover, the grid infrastructure requires reinforcements to cope with increasing electrical energy demand. Flexible AC transmission systems (FACTS) and high-voltage DC (HVDC) transmission systems allow higher grid capacity, efficient transmission over long distances and sub-sea electrical energy transfer. Efficient sub-sea transmission is required for off-shore wind- and intercontinental grid connections. It is predicted that basic power electronic building blocks (PEBB) utilizing SiC-based semiconductor devices will provide converter system benefits (e.g., reduced number of series connected devices, less complex system, lower energy losses, lower cooling requirements and smaller station footprint), in comparison to systems employing Si-based semiconductor devices. The main objective of this thesis is to design, evaluate and identify the performance, requirements, and limitations of high-voltage SiC devices suitable for high-power applications. The SiC semiconductor device characteristics have been investigated by two-dimensional numerical simulations and experiments to assess the suitability in high-power applications. A calibrated set of technology computer-aided design (TCAD) simulation models are used as foundation for estimating the performance of SiC PiN diodes, SiC insulated-gate bipolar transistors (IGBTs) and SiC gate turn-off (GTO) thyristors with blocking voltage capabilities in the range of 20–50 kV. The static and dynamic device performances are assessed along with related gate driver requirements and snubber design requirements. The devices characteristic are studied using physical parameters of device layer structures, device processing parameters, and varying circuit parameters using mixed-mode simulations that results in a wide range of data for device performance predictability. Moreover, the experimental characterization of 10 kV, 100 A SiC metal-oxide semiconductorfield-effect transistor (MOSFET) power modules are demonstrated and compared to Si counterparts. The junction termination extension (JTE) design aspects for 20, 30, 40, and 50 kV devices are investigated where the results are used to predict the active area ratio for each blocking voltage class. In addition, the limit of critical operating conditions such as dynamic avalanche and current filamentation are derived by TCAD simulations, which indicates that the critical operation points are significantly higher than that of Si-based counterparts. The wide-range simulation data have been used in benchmarking SiC-based devices with Si counterparts in an application case of a 1 GW, 640 kV, modular multilevel converter (MMC)-based HVDC system. The analytical benchmark model indicates an energy loss reduction to approximately half by employing SiC device configurations compared to state-of-the-art Si bi-mode insulated gate transistors (BiGTs). The low energy losses along with the benefits by reduction of system complexity, control hardware, cables, and fibers (due to a lower amount of PEBBs), the SiC converter design presents a promising alternative to existing Si-based high-power modular multilevel converters.

Place, publisher, year, edition, pages
KTH Royal Institute of Technology, 2021
Series
TRITA-EECS-AVL ; 2021:37
Keywords
4H-SiC, Current Filamentation, Device Characterization, Dynamic Avalanche, JTE Structure, Junction Termination Extension Design, SiC BJT, SiC GTO Thyristor, SiC IGBT, SiC MOSFET, SiC PiN Diode, Silicon Carbide, TCAD Simulation, Wide bandgap device
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Electrical Engineering
Identifiers
urn:nbn:se:kth:diva-295004 (URN)978-91-7873-894-6 (ISBN)
Public defence
2021-06-08, Sten Velander Seminarroom, Teknikringen 33, Stockholm, 08:00 (English)
Opponent
Supervisors
Funder
SweGRIDS - Swedish Centre for Smart Grids and Energy Storage, CP16
Note

QC 20210518

Available from: 2021-05-18 Created: 2021-05-18 Last updated: 2022-07-08Bibliographically approved

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Johannesson, DanielNee, Hans-Peter

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