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Static and Dynamic Performance of Charge-Carrier Lifetime-Tailored High-Voltage SiC p-i-n Diodes With Capacitively Assisted Switching
KTH, School of Electrical Engineering and Computer Science (EECS), Electrical Engineering, Electric Power and Energy Systems.ORCID iD: 0000-0001-5521-4135
Res Inst Sweden RISE, S-41756 Kista, Sweden..
Linnaeus Univ, S-35195 Växjö, Sweden..
KTH, School of Electrical Engineering and Computer Science (EECS), Electrical Engineering, Electric Power and Energy Systems.ORCID iD: 0000-0002-1755-1365
2022 (English)In: IEEE transactions on power electronics, ISSN 0885-8993, E-ISSN 1941-0107, Vol. 37, no 10, p. 12065-12079Article in journal (Refereed) Published
Abstract [en]

Recent advancements in the silicon carbide (SiC) power semiconductor technology offer improvements for high-power converters, where today silicon (Si) devices are still dominant. Bipolar SiC devices feature particularly good conduction capability while blocking high voltages. With expected advances in SiC material quality and processing technology, resulting in higher charge carrier lifetimes, methods for tailoring will be required. In this article, three differently optimized 10-kV SiC p-i-n diodes are compared regarding their switching and conduction performance in a 50-kHz LCC converter with a high output voltage. The converter topology features capacitively assisted switching, resulting in reduced switching losses for diodes with short reverse recovery tails. One diode group was subjected to a novel carrier lifetime tailoring method, involving simultaneous annihilation and generation of carbon vacancies. Another group was tailored via proton irradiation. Tradeoffs for the optimization of the diodes are highlighted. The analysis is supported by circuit simulations, device simulations, static measurements, switching waveform measurements, and calorimetric loss measurements. The results show a total rectifier loss reduction of 37%, compared to a state-of-the-art implementation with eight 1-kV Si diodes. The switching losses account for 3%-19% of the total losses, indicating a much higher possible operation frequency.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2022. Vol. 37, no 10, p. 12065-12079
Keywords [en]
Charge carrier lifetime, Silicon carbide, Semiconductor diodes, Carbon, Silicon, Loss measurement, Switches, Charge-carrier lifetime, converters, power semiconductor diodes, rectifiers, resonant power conversion, semiconductor device testing, silicon carbide (SiC)
National Category
Energy Engineering
Identifiers
URN: urn:nbn:se:kth:diva-315547DOI: 10.1109/TPEL.2022.3172666ISI: 000814786200061Scopus ID: 2-s2.0-85132537179OAI: oai:DiVA.org:kth-315547DiVA, id: diva2:1682016
Note

QC 20220708

Available from: 2022-07-08 Created: 2022-07-08 Last updated: 2022-07-08Bibliographically approved

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Jacobs, KeijoNee, Hans-Peter

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