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Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8180-1966
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0003-2552-6415
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.
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2024 (English)Manuscript (preprint) (Other academic)
Abstract [en]

We describe a transducer for low-temperature atomic force microscopy based on electromechanical coupling due to a strain-dependent kinetic inductance of a superconducting nanowire. The force sensor is a bending triangular plate (cantilever) whose deflection is measured via a shift in the resonant frequency of a high-Q superconducting microwave resonator at 4.5 GHz. We present design simulations including mechanical finite-element modeling of surface strain and electromagnetic simulations of meandering nanowires with large kinetic inductance. We discuss a lumped-element model of the force sensor and describe the role of an additional shunt inductance for tuning the coupling to the transmission line used to measure the microwave resonance. A detailed description of our fabrication is presented, including information about the process parameters used for each layer. We also discuss the fabrication of sharp tips on the cantilever using focused electron beam-induced deposition of platinum. Finally, we present measurements that characterize the spread of mechanical resonant frequency, the temperature dependence of the microwave resonance, and the sensor's operation as an electromechanical transducer of force. 

Place, publisher, year, edition, pages
2024. Vol. 15, p. 242-255
Keywords [en]
force sensing, atomic force microscopy, kinetic inductance, superconductivity, optomechanics
National Category
Nano Technology
Research subject
Physics, Material and Nano Physics
Identifiers
URN: urn:nbn:se:kth:diva-343023DOI: 10.48550/arXiv.2310.03569OAI: oai:DiVA.org:kth-343023DiVA, id: diva2:1834623
Funder
EU, Horizon 2020, 828966Swedish Foundation for Strategic Research, ITM17-0343
Note

QC 20240208

Available from: 2024-02-05 Created: 2024-02-05 Last updated: 2024-02-20Bibliographically approved
In thesis
1. Superconducting kinetic inductance devices for nanoscale force sensing
Open this publication in new window or tab >>Superconducting kinetic inductance devices for nanoscale force sensing
2024 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

In this thesis, we present a force sensor for atomic force microscopy based on cavity optomechanical principles. We explain the function, design, fabrication and characterisation of the force sensor. The mechanical part of the force sensor consists of a cantilever with a very fine tip. Near the cantilever's base is an LC circuit with resonance frequency in the range 4-5 GHz. The inductor consists of a superconducting meandering nanowire that changes its inductance when strained. Thus, the mechanical movement of the cantilever can be detected by measuring how the resonance frequency of the LC circuit changes. The mechanical movement gives rise to sidebands in the microwave spectrum. One detection method is based on the circuit being driven by two microwave tones while the cantilever is actuated near its mechanical resonance by a piezoelectric shaker mounted near the sensor. The amplitude of the measured signal depends on the phase difference between the motion of the cantilever and the microwave tones.

Key steps in the fabrication include release of the cantilever by etching away the substrate from both the front and back sides, and deposition of a tip on the free end of the cantilever. Fabrication is done over an entire semiconductor wafer and exhibits high yield. The optomechanical coupling strength g0 was measured in the order of a few Hertz at temperatures of a few millikelvin. However, an accurate calibration of the coupling constant relating mechanical movement of the cantilever to the shift of resonance frequency of the LC circuit was not possible due the presence of a non-thermal fluctuating force. We also present how the microwave losses in the LC circuit vary in the range 1.7-6 K. Our circuits exhibit higher losses than expected from thermal-equilibrium quasiparticles, which we attribute to the circuit dielectric. Quasiparticle losses set an upper limit on the quality factor that our circuits can achieve regardless of topology. In addition, the LC circuit exhibits a nonlinear relationship between current and kinetic inductance that enables parametric amplification of the mechanical sidebands. Thus, the presented force sensor integrates the force transducer (cantilever), the detector (LC circuit) and a parametric signal amplifier (via the nonlinearity of the LC circuit) in one and the same component.

Abstract [sv]

Vi presenterar i denna avhandling en kraftsensor för atomkraftsmikroskopi baserad på kavitetsoptomekaniska principer. Vi förklarar kraftsensorns funktion, design, tillverkning och karaktärisering. Kraftsensorns mekaniska del består av en vipparm med en mycket fin spets. Nära vipparmens fästpunkt finns en LC-krets med en resonansfrekvens i mikrovågsområdet 4-5 GHz. Induktansen utgörs av en supraledande slingrande nanotråd som ändrar sin induktans när den töjs. Således kan vipparmens mekaniska rörelse detekteras med en mikrovågssignal som mäter hur LC-kretsens resonansfrekvens förändras. Vipparmens mekaniska rörelse ger upphov till sidoband i mikrovågsspektrat. En detektionsmetod bygger på att kretsen drivs av två mikrovågstoner samtidigt som vipparmen bringas i mekanisk resonans av en piezoelektrisk vibrator monterad nära sensorn. Amplituden på den uppmätta signalen beror på fasskillnaden mellan vipparmens rörelse och mikrovågstonerna.

Nyckelstegen i tillverkningen inkluderar deponeringen av spetsen på vipparmen och dess friläggning genom bortetsning av substratet från både fram- och baksidan. Tillverkningen görs över en hel halvledarbricka och uppvisar en hög andel fungerande komponenter. Den optomekaniska kopplingsstyrkan g0 uppmättes i storleksordningen några få Hertz vid temperaturer av några millikelvin. En noggrann kalibrering mellan vipparmens mekaniska rörelse och förskjutningen av LC-kretsens resonansfrekvens försvåras dock av en ännu oidentifierad icketermisk kraft. Vi presenterar även hur mikrovågsförlusterna i LC-kretsen varierar i området 1.7-6 K. Våra kretsar uppvisar större förluster än förväntat vilket vi tillskriver kretsens dielektrikum. Förlusterna från kvasipartiklar sätter en övre gräns för kvalitetsfaktorn som våra kretsar kan uppnå oavsett topologi. LC-kretsen uppvisar samtidigt ett icke-linjärt förhållande mellan ström och kinetisk induktans vilket möjliggör parametrisk förstärkning av de mekaniska sidobanden för att öka känsligheten. Den presenterade kraftsensorn integrerar således kraftomvandlaren (vipparmen), detektorn (LC-kretsen) och en parametrisk signalförstärkare (via LC-kretsens icke-linjäritet) i en och samma komponent.

Place, publisher, year, edition, pages
Stockholm: Kungliga tekniska högskolan, 2024. p. 85
Series
TRITA-SCI-FOU ; 2024:09
Keywords
optomechanics, force sensing, atomic force microscopy, kinetic inductance, superconductivity, strain, meandering nanowires, optomekanik, kraftavkänning, atomkraftsmikroskopi, kinetisk induktans, supraledning, töjning, slingrande nanotrådar
National Category
Nano Technology
Research subject
Physics, Material and Nano Physics
Identifiers
urn:nbn:se:kth:diva-343028 (URN)978-91-8040-842-4 (ISBN)
Public defence
2024-03-01, FA32, Albanova, Roslagstullsbacken 21, Stockholm, 09:00 (English)
Opponent
Supervisors
Funder
EU, Horizon 2020, 828966Swedish Foundation for Strategic Research, ITM17-0343
Note

QC 2024-02-06

Available from: 2024-02-06 Created: 2024-02-05 Last updated: 2024-02-12Bibliographically approved

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Roos, August K.Scarano, ErmesArvidsson, ElisabetHolmgren, ErikHaviland, David B.

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