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Machine Learning-Aided Digital Twin Framework With Noninvasive Parameter Estimation for Voltage Source Converters
KTH, School of Electrical Engineering and Computer Science (EECS), Electric Power and Energy Systems.ORCID iD: 0000-0002-9406-5600
KTH, School of Electrical Engineering and Computer Science (EECS), Electric Power and Energy Systems.ORCID iD: 0000-0002-2793-9048
2026 (English)In: IEEE Transactions on Industrial Electronics, ISSN 0278-0046, E-ISSN 1557-9948, Vol. 73, no 7, p. 10918-10930Article in journal (Refereed) Published
Abstract [en]

Digital twin (DT) has gained increasing attention in different areas due to its capability of replicating the behaviors and performance of the physical system. It is emerging as a promising tool for optimizing the design, control, and maintenance of power electronic systems. This article proposes a machine learning (ML)-enabled framework for DT model development and noninvasive parameter estimation of voltage source converters (VSCs). A DT model of the converter system is first established, and extensive parameter sweeping simulations under various operating conditions are conducted to generate a comprehensive dataset for an artificial neural network (ANN). The trained ANN identifies key component parameters directly from measurements without additional hardware, thereby bridging the DT model and the physical system. These parameters are then used to update the DT model, ensuring high fidelity and synchronization with the physical counterpart. Experimental results confirm the effectiveness of the proposed framework, achieving accurate parameter estimation and high-fidelity DT. Finally, a DT-based fault diagnosis case study is demonstrated, highlighting its practical applicability.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2026. Vol. 73, no 7, p. 10918-10930
Keywords [en]
Condition monitoring, digital twin (DT), fault diagnosis, machine learning (ML) framework, voltage source converter (VSC)
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering Control Engineering Signal Processing
Identifiers
URN: urn:nbn:se:kth:diva-377860DOI: 10.1109/TIE.2026.3657019ISI: 001682831800001Scopus ID: 2-s2.0-105031110127OAI: oai:DiVA.org:kth-377860DiVA, id: diva2:2044607
Note

QC 20260603

Available from: 2026-03-10 Created: 2026-03-10 Last updated: 2026-06-03Bibliographically approved

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Wan, YihaoXu, Qianwen

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  • apa
  • ieee
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