X-ray near-field multi-slice ptychography for in-situ imagingShow others and affiliations
2025 (English)In: Scientific Reports, E-ISSN 2045-2322, Vol. 15, no 1, article id 32150
Article in journal (Refereed) Published
Abstract [en]
In-situ imaging of chemical reactions can provide valuable insight into nanoparticle growth and structural evolution. Hard X-ray imaging is an excellent tool for this purpose, as it combines high spatial resolution with high penetration depth, allowing for realistic reaction environments. While far-field ptychography is a well-established method at synchrotron radiation sources, its near-field analog has received less attention. In this work we show that near-field multi-slice ptychography is a competitive method for high-resolution in-situ imaging by studying the formation of gold nanocages via galvanic replacement. Our work extends near-field X-ray ptychography to sub-50 nm spatial resolution by using multilayer Laue lenses. These high numerical aperture optics enable to distinguish sample layers that are separated by less than 100 µm by multi-slicing techniques.
Place, publisher, year, edition, pages
Springer Nature , 2025. Vol. 15, no 1, article id 32150
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-383759DOI: 10.1038/s41598-025-15610-8ISI: 001561964200038PubMedID: 40890230Scopus ID: 2-s2.0-105014941485OAI: oai:DiVA.org:kth-383759DiVA, id: diva2:2081487
Note
QC 20260629
2026-06-292026-06-292026-06-29Bibliographically approved