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Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films
KTH, School of Industrial Engineering and Management (ITM), Materials Science and Engineering.
KTH, School of Industrial Engineering and Management (ITM), Materials Science and Engineering.
KTH, School of Industrial Engineering and Management (ITM), Materials Science and Engineering.
KTH, School of Industrial Engineering and Management (ITM), Materials Science and Engineering.ORCID iD: 0000-0001-5678-5298
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2009 (English)In: Journal of Alloys and Compounds, ISSN 0925-8388, E-ISSN 1873-4669, Vol. 471, no 1-2, p. 278-281Article in journal (Refereed) Published
Abstract [en]

Nanostructured phosphorous-alloyed Bi2Te3 thick films have been prepared by electrochemical deposition. The average grain size of the films was calculated to be 14-26nm based on Scherrer's equation. The effect of P on the Seebeck coefficient of the Bi2Te3 thick film was investigated. The results show that P-alloyed thick film has n-type conductivity with the Seebeck coefficient of -35 mu V/K. The correlation between P site occupancy in the crystal and the Seebeck coefficient was discussed.
Place, publisher, year, edition, pages
2009. Vol. 471, no 1-2, p. 278-281
Keywords [en]
Thermoelectric materials, Microstructure, Seebeck microprobe, thermoelectric-materials, single-crystals, bi2te3, defects
Identifiers
URN: urn:nbn:se:kth:diva-18344DOI: 10.1016/j.jallcom.2008.03.088ISI: 000265086300068Scopus ID: 2-s2.0-60849119581OAI: oai:DiVA.org:kth-18344DiVA, id: diva2:336390
Note
QC 20100525Available from: 2010-08-05 Created: 2010-08-05 Last updated: 2022-09-07Bibliographically approved

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Toprak, Muhammet S.

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Zhou, JieLi, ShuaiSoliman, Herrera M. A.Toprak, Muhammet S.Muhammed, Mamoun
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