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The Role of the Parasitic Capacitance of the Inductorin Boost Converters with Normally-On SiC JFETs
Warsaw University of Technlogy.
KTH, School of Electrical Engineering (EES), Electrical Energy Conversion.ORCID iD: 0000-0001-8857-3505
KTH, School of Electrical Engineering (EES), Electrical Energy Conversion.
KTH, School of Electrical Engineering (EES), Electrical Energy Conversion.ORCID iD: 0000-0002-1755-1365
2012 (English)In: 2012 7th International Power Electronics and Motion Control Conference (IPEMC), IEEE conference proceedings, 2012, p. 1842-1847Conference paper, Poster (with or without abstract) (Refereed)
Abstract [en]

In this paper the impact of the parasitic capacitance ofthe inductor on the performance of a fast-switching boostconverters with SiC JFETs is discussed. Two inductor designs,one conventional and another with a space between the windinglayers, are investigated and their parasitic capacitances aremeasured by different methods. The air-gap between the windinglayers reduced the inductor self-capacitance more than 8 times.The two inductors were used in a 2 kW, 100 kHz boost converterwith a normally-on SiC JFET and their performance wascompared. When the inductor with a low self-capacitance wasused, there were fewer oscillations during the switchingtransients and the losses were reduced about 16 %.

Place, publisher, year, edition, pages
IEEE conference proceedings, 2012. p. 1842-1847
Keywords [en]
Silicon carbide, parasictic capacitanse, inductor design, DC-DC converter, Silicon Carbide, JFET
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-103053DOI: 10.1109/IPEMC.2012.6259118Scopus ID: 2-s2.0-84866778214ISBN: 978-1-4577-2085-7 (print)OAI: oai:DiVA.org:kth-103053DiVA, id: diva2:558144
Conference
2012 IEEE 7th International Power Electronics and Motion Control Conference - ECCE Asia June 2-5, 2012, Harbin, China
Note

QC 20121005

Available from: 2012-10-05 Created: 2012-10-02 Last updated: 2025-03-24Bibliographically approved

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Nee, Hans-Peter

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