kth.sePublications KTH
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Scalable Graph Classification via Random Walk Fingerprints
LMU Munich, Munich, Germany.
KTH, School of Electrical Engineering and Computer Science (EECS), Computer Science, Theoretical Computer Science, TCS.
University of Vienna, Vienna, Austria.
2024 (English)In: Proceedings - 24th IEEE International Conference on Data Mining, ICDM 2024, Institute of Electrical and Electronics Engineers (IEEE) , 2024, p. 231-240Conference paper, Published paper (Refereed)
Abstract [en]

Graph classification has long been a focus of net-work mining, with graph kernel methods and representation learning at the forefront. Despite their success, many of these studies require heavy computation, making them impractical for large-scale datasets. In this paper, we design a novel structural feature extraction technique that leverages node subsets and random walk probabilities, presenting a scalable, unsupervised, and easily interpretable alternative. Initially, we partition each graph based on the structural roles of nodes. This process creates soft alignments of node subsets across graphs of varying sizes. Then, we measure the connection strengths within and between these subsets, which form the fingerprints for graph classification. Additionally, this technique can seamlessly incorporate node features. Through empirical assessment encompassing a broad range of graph datasets, we demonstrate that our method achieves high levels of computational efficiency while maintaining robust classification accuracy. Code and data are available at https://github.com/KXDY233/RWF.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2024. p. 231-240
Keywords [en]
Feature Extraction, Graph Classification, Scalability
National Category
Computer Sciences
Identifiers
URN: urn:nbn:se:kth:diva-361437DOI: 10.1109/ICDM59182.2024.00030Scopus ID: 2-s2.0-86000239902OAI: oai:DiVA.org:kth-361437DiVA, id: diva2:1945867
Conference
24th IEEE International Conference on Data Mining, ICDM 2024, Abu Dhabi, United Arab Emirates, December 9-12, 2024
Note

Part of ISBN 9798331506681

QC 20250320

Available from: 2025-03-19 Created: 2025-03-19 Last updated: 2025-03-20Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records

Wang, Honglian

Search in DiVA

By author/editor
Wang, Honglian
By organisation
Theoretical Computer Science, TCS
Computer Sciences

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 87 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf