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Thermal improvement of Press-Pack Packages: Pressure Dependent Thermal Contact Resistance with a thin Silver Interlayer between Molybdenum substrate and Silicon Carbide chip
KTH, Skolan för elektro- och systemteknik (EES), Elkraftteknik.ORCID-id: 0000-0002-1755-1365
Vise andre og tillknytning
2017 (engelsk)Inngår i: 2017 IEEE International Workshop on Integrated Power Packaging, IWIPP 2017, IEEE, 2017Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

In typical press-pack, free-floating packages the thermal contact resistance between chip and substrate is a major limiting factor for the cooling ability of the power module. We report an introduction of a new, thin Silver interlayer between Molybdenum substrate and chip, and how it improves the thermal contact. The thermal contact resistances were measured with and without a Silver interlayer at different pressures. The surface roughness of the SiC chip and the Molybdenum substrate were characterized. The thermal contact resistances were measured at three different heating power levels. The results show a significant reduction of the thermal contact resistance with only a few micrometer Silver interlayer. The improved cooling effect of a Silver interlayer was also demonstrated with a fluid dynamics type of 3 D simulation comparing temperature distributions with and without a Silver interlayer. These results project a possible thermal improvement in press-pack packages.

sted, utgiver, år, opplag, sider
IEEE, 2017.
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-218243DOI: 10.1109/IWIPP.2017.7936753ISI: 000414286300009Scopus ID: 2-s2.0-85025660047ISBN: 978-1-5090-4278-4 (tryckt)OAI: oai:DiVA.org:kth-218243DiVA, id: diva2:1160077
Konferanse
IEEE International Workshop on Integrated Power Packaging (IWIPP), Delft, NETHERLANDS, 5-7 April 2017
Merknad

Part of proceedings: ISBN 978-1-5090-4278-4

QC 20171124

Tilgjengelig fra: 2017-11-24 Laget: 2017-11-24 Sist oppdatert: 2022-07-11bibliografisk kontrollert

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Nee, Hans-Peter

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