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Thermal Contact Resistance Improvement Between Clip Attached TO-247 Package and Heat Sink with Insertion of an Ultra-Thin Interlayer Silver Film
KTH, Skolan för elektroteknik och datavetenskap (EECS), Elektroteknik, Elkraftteknik.ORCID-id: 0000-0002-8712-9899
KTH, Skolan för elektroteknik och datavetenskap (EECS), Elektroteknik, Elkraftteknik.ORCID-id: 0000-0002-1755-1365
2025 (engelsk)Inngår i: 31st International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2025 - Proceedings, Institute of Electrical and Electronics Engineers (IEEE) , 2025Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

We report lower experimental values of thermal contact resistance between TO-247 package and aluminum heat sink compared to calculated values, achieved by introduction of an ultra-thin interlayer silver film. In the calculation of thermal contact resistance, we have also analyzed the effect of air pressure inside the microscopic voids within the interface. The probable explanation of the lowered thermal contact resistance is a mechanical pressure dependent softening of the ultra-thin films, filling out microscopic voids.

sted, utgiver, år, opplag, sider
Institute of Electrical and Electronics Engineers (IEEE) , 2025.
Emneord [en]
TIM, TO 247, component, electronics cooling, power package, thermal conductance, thermal contact resistance, thermal interface material
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-385513DOI: 10.1109/THERMINIC65879.2025.11216892Scopus ID: 2-s2.0-105023641410OAI: oai:DiVA.org:kth-385513DiVA, id: diva2:2086570
Konferanse
31st International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2025, Naples, Italy, September 24-26, 2025
Merknad

Part of ISBN 9798331594862

QC 20260715

Tilgjengelig fra: 2026-07-15 Laget: 2026-07-15 Sist oppdatert: 2026-07-15bibliografisk kontrollert

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Toth-Pal, ZsoltNee, Hans-Peter

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